Abstract:A spatial and tensor deconvolution procedure is proposed for the analysis of cumulative Raman frequency shifts recorded in silicon surface zones containing a Blister-type contact stress field. The procedure is further applied to the quantitative determination of the three independent values of phonon deformation potentials for the Si lattice. Phonon potentials are experimentally obtained for an (110) oriented Si single-crystal containing a pyramidal (Vickers) indentation print. A cross-polarized laser microprobe operating at a visible wavelength enabled us to precisely retrieve the three independent phonon potentials for Si. The presented method requires a minimum amount of material and can be applied with a single measurement set, while previously published characterizations required the availability of relatively large and differently oriented samples. The proposed experimental method is particularly suitable for in situ assessments of phonon deformation potentials in thin/opaque samples with high refractive index.

Microscopic calculations on Raman scattering from acousitc phonons confined in Si nanocrystals

Microscopic Calculations of Raman Scattering from Acoustic Phonons Confined in Si Nanocrystals

Raman spectroscopy of optical phonons confined in semiconductor quantum dots and nanocrystals

Low-Frequency Raman Scattering of Ge and Si Nanocrystals in Silica Matrix

Microscopic Modeling Of Phonon Modes In Semiconductor Nanocrystals

Phonon Mode Study of Si Nanocrystals Using Micro-Raman Spectroscopy

Temperature Dependence of the First-Order Raman Scattering in Silicon Nanowires

Spatially and Tensor-Resolved Raman Analysis for the Determination of Phonon Deformation Potentials on the Microscopic Scale in Si Single-Crystal

Phonon-Defect Scattering in Doped Silicon by Molecular Dynamics Simulation

Low-Frequency Raman Scattering from Nanocrystals Caused by Coherent Excitation of Phonons

Modification of the phonon thermal conductivity in spatially confined semiconductor nanofilms under stress fields

Raman Scattering Study on Phonon Anisotropic Properties of SiC

Raman Spectral Study of Silicon Nanowires: High-order Scattering and Phonon Confinement Effects

The Observation of the Low-Frequency Acoustic Phonon Torsional Modes in Nanocrystalline Silicon

The Vibrational Density of States and Specific Heat of Si Nanocrystals

Phonon Confinement in Stressed Silicon Nanocluster

RAMAN SPECTRA FROM ACOUSTIC PHONONS IN NEARLY PERIODIC SiGe/Si SUPERLATTICES

Calculations on the size effects of Raman intensities of silicon quantum dots

Reconstruction Of Phonon Dispersion In Si Nanocrystals

OBSERVATION OF SPECTRA BY RAMAN SCATTERING ON a-<font>Si:H</font>/a-<font>SiN</font><sub>x</sub>:<font>H</font> SUPERLATTICES

Raman Scattering Intensities of Folded Longitudinal Acoustic Phonons in Ge X Si 1- X / Si Superlattices