Abstract:Ptychographic diffractive imaging has the potential for structural determination of materials without the constraints of relatively small, isolated samples required for conventional coherent diffractive imaging. The increased illumination diversity introduced using multiple measurements (overlapped probe positions) also provides higher sensitivity to phase changes in weakly scattering samples. The resolution of a ptychographic reconstruction is ultimately determined by the diffraction limit for the wavelength of the radiation used. However, in practical experiments using electrons either the maximum collection angle of the detector used to record the data or the partial coherence of the source impose lower resolution limits. Nonetheless for medium energy electrons this suggests a potential sub 0.1 nm spatial resolution limit, comparable to that obtained using aberration corrected instruments. However, simultaneous visualization of light and heavier atoms in specimens using ptychography at sub 0.1 nm resolution presents a significant challenge. Here, we demonstrate a ptychographic reconstruction of a LaB 6 crystal in which light B atoms were clearly resolved together with the heavy La atoms in the reconstructed phase. The technique used is general and can also be applied to non-crystalline and extended crystalline samples. As such it offers an alternative future basis for imaging the atomic structure of materials, particularly those containing low atomic number elements.

XPS Al Kα and high energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk boron

1S2s2p23s6p–<…

1s2s2p23s 6P-1s2p33s 6s0transitions in O IV

High-Resolution X-Ray Absorption Studies of Core Excitons in Hexagonal Boron Nitride

HAXPES reference spectra of Si, SiO2, SiN, SiC, and poly(dimethyl siloxane) with Cr Kα excitation

Sr-arpes study on the valence band dispersions in single crystal c_(60)

SR-arpes study on the valence band dispersions in single crystal C60

Synchrotron Radiation Photoemission Spectrum Study on K_3C_(60) Film

Electron Band-Structure Of C-60 Single-Crystal Using Synchrotron-Radiation

High-precision,reference-free measurements of transitions in boron-like sulfur and argon

High-accuracy bulk electronic bandmapping with eliminated diffraction effects using hard X-ray photoelectron momentum microscopy

High-precision, reference-free measurements of 2p $\rightarrow$ 1s transitions in boron-like sulfur and argon

BULK BAND GAPS IN DIVALENT HEXABORIDES: A SOFT X-RAY EMISSION STUDY

Coordination Number of Doped Boron Atoms in Photochemically-Deposited Amorphous Silicon Studied by X-Ray Photoelectron Spectroscopy

High-Resolution Angle-Resolved Photoemission Study of the Al(100) Single Crystal

Electron Ptychographic Diffractive Imaging of Boron Atoms in LaB 6 Crystals

Near-surface analysis of magnetron sputtered AlCrNbYZrN x high entropy materials resolved by HAXPES

Table-top source for x-ray absorption spectroscopy with photon energies up to 350 eV

Probing the Local Environment in Potassium Salts and Potassium-Promoted Catalysts by Potassium Valence-to-Core X-ray Emission Spectroscopy

Nickel Monochromated Al Kα XPS Spectra from the Physical Electronics Model 5400 Spectrometer

C K-edge NEXAFS spectra of graphene with physical and chemical defects: a study based on density functional theory