Nickel Monochromated Al Kα XPS Spectra from the Physical Electronics Model 5400 Spectrometer

A. N. Mansour

DOI: https://doi.org/10.1116/1.1247750

1994-07-01

Surface Science Spectra

Abstract:Nickel spectra were measured with the Physical Electronics Model 5400 x-ray photoelectron spectrometer (XPS) using monochromatic Al Kα at five pass energy settings corresponding to analyzer resolutions of 1.34, 0.54, 0.27, 0.13, and 0.067 eV. The specimen is a high purity 4 μm thick nickel foil (99.95%) obtained from the Goodfellow Corporation and was sputter-cleaned by 3 keV Ar ions for 5 min. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the Ni 2p (845–895 eV), Ni 3p (58–88 eV), Ni 3s (100–130 eV), Ni 2s (995–1025 eV), valence band region (−5–20 eV), and Ni LVV Auger lines (611–661 eV) were measured at analyzer energy resolutions of 0.54, 0.27, and 0.13 eV. Those of the Ni 2p (847–885 eV), Ni 3p (59–84 eV), valence band region (−3–15 eV), and Ni LVV Auger lines (612–655 eV) were also measured at analyzer energy resolution of 0.067 eV.

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