Abstract:In x-ray photoelectron spectroscopy (XPS), a sample is exposed to low energy x rays (approximately 1 keV), and the resultant photoelectrons are analyzed with high precision for kinetic energy. After correction for inelastic scattering, the measured photoelectron spectrum should reflect the valence band density of states, as well as the binding energies of several core electronic levels. All features in this spectrum will be modulated by appropriate photoelectric cross sections, and there are several types of final-state effects which could complicate the interpretation further. In comparison with ultraviolet photoelectron spectroscopy (UPS), XPS has the following advantages: (1) the effects of inelastic scattering are less pronounced and can be corrected for by using a core reference level, (2) core levels can also be used to monitor the chemical state of the sample, (3) the free electron states in the photoemission process do not introduce significant distortion of the photoelectron spectrum, and (4) the surface condition of the sample does not appear to be as critical as in UPS. XPS seems to be capable of giving a very good description of the general shape of the density-of-states function. A decided advantage of UPS at the present time, however, is approximately a fourfold higher resolution. We have used XPS to study the densities of states of the metals Fe, Co, Ni, Cu, Ru, Rh, Pd, Ag, Os, Ir, Pt, and Au, and also the compounds ZnS, CdCl2, and HgO. The d bands of these solids are observed to have systematic behavior with changes in atomic number, and to agree qualitatively with the results of theory and other experiments. A rigid band model is found to work reasonably well for Ir, Pt and Au. The d bands of Ag, Ir, Pt, Au and HgO are found to have a similar two-component shape.

Copper Mg Kα XPS Spectra from the Physical Electronics Model 5400 Spectrometer

Nickel Mg Kα XPS Spectra from the Physical Electronics Model 5400 Spectrometer

Nickel Monochromated Al Kα XPS Spectra from the Physical Electronics Model 5400 Spectrometer

Theoretical Studies on Near-Edge X-Ray Absorption Fine Structure of (So+2o)/cu(100)

Using Auger transitions as a route to determine the oxidation state of copper in high-pressure electron spectroscopy

Ultraviolet Photoelectron Spectroscopy of Copper Clusters

Electronic Structure and X-Ray Absorption Near Edge Spectroscopy of Copper Oxides

Natural and Synthetic Copper Phyllosilicates Studied by XPS

Emission of K -, L - and M - Auger Electrons from Cu Atoms

The Molybdenum K-shell X-ray Emission Spectrum

Optical and Photoelectric Properties of Copper Phthalocyanine/Cadmium Sulphide Multilayer Films Prepared by Vacuum Sublimation

UV/Vis Spectroscopy of Copper Formate Clusters: Insight into Metal-Ligand Photochemistry

Analysis of Copper (II) Mixed Ligand Complexes Using Extended X-ray Absorption Fine Structure Data

Natural linewidths of Cu Kα1,2 spectra obtained with an antiparallel double-crystal x-ray spectrometer

UPS study of electronic states of CuPc/Ag(110)

Electronic Densities of States from X-Ray Photoelectron Spectroscopy

Retrieving the Energy Band of Cu Thin Films Using Quantum Well States

Measurement of the Electron Temperature in a Metallic Copper Using Ultrafast Laser-Induced Breakdown Spectroscopy

Spectroscopic Properties of Cu(L-met)2, Cu(DL-met)2, Cu(L-ala)2and Cu(DL-ala)2˙H2O and Qualitative Explanations to the Magnetism and Relative Ordering of the One-Electron Energy Levels.

Determination of the Electron-Lattice Coupling Strength of Copper with Ultrafast MeV Electron Diffraction

Multiplet XPS analysis of the Mn 2p for Mn3O4 thin films