Nickel Mg Kα XPS Spectra from the Physical Electronics Model 5400 Spectrometer

A. N. Mansour

DOI: https://doi.org/10.1116/1.1247749

1994-07-01

Surface Science Spectra

Abstract:Nickel by Mg Kα XPS Nickel spectra were measured with the Physical Electronics Model 5400 x-ray photoelectron spectrometer (XPS) using unmonochromatized Mg Kα x rays and four pass energy settings corresponding to analyzer energy resolutions of 1.34, 0.54, 0.27, and 0.13 eV. The specimen is a high purity (99.95%) 4 μm thick nickel foil that was obtained from the Goodfellow Corporation and was sputter-cleaned by 3 keV Ar ions for 5 min. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.35 eV. Multiplexes of the Ni 2p (845–895 eV), Ni 3p (55–88 eV), Ni 3s (100–130 eV), Ni 2s (995–1025 eV), valence band region (−5–20 eV), and Ni LVV Auger lines (378–428 eV) were measured at analyzer energy resolutions of 0.54, 0.27, and 0.13 eV.

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