BULK BAND GAPS IN DIVALENT HEXABORIDES: A SOFT X-RAY EMISSION STUDY

J. D. DENLINGER,G.-H. GWEON,J. W. ALLEN,A. D. BIANCHI,Z. FISK
DOI: https://doi.org/10.1142/s0218625x0200372x
2002-04-01
Surface Review and Letters
Abstract:Boron K-edge soft X-ray emission and absorption are used to address the fundamental question of whether divalent hexaborides are intrinsic semimetals or defect-doped band gap insulators. These bulk-sensitive measurements, complementary and consistent with surface-sensitive angle-resolved photoemission experiments, confirm the existence of a bulk band gap and the location of the chemical potential at the bottom of the conduction band.
chemistry, physical,physics, condensed matter
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