Damage effect evaluation of CCD irradiated by laser based on multi-source information fusion

Chun-Hui Niu,Ting Yu

DOI: https://doi.org/10.1364/oe.515567

IF: 3.8

2024-05-04

Optics Express

Abstract:Chun-Hui Niu, Ting Yu This study introduces an advanced approach for assessing the damage state of charge-coupled devices (CCDs) caused by laser interactions, ... [Opt. Express 32, 18201-18215 (2024)]

optics

What problem does this paper attempt to address?

Researches on Laser Damage Resistance of Optical Films

Cheng Yong,Lu Yimin,Tang Huang,Guo Yanlong,Huang Guojun,Liu Xu

DOI: https://doi.org/10.11884/hplpb201628.070201

2016-01-01

Abstract:Along with the development of high energy or high power lasers,especially laser weapon and lasers for controlled nuclear fusion,the laser induced damage threshold of the optical films gradually becomes the bottleneck against the development of the lasers,which is of considerable interest from the world.Laser induced damage mechanism of optical films,test flat and method for laser induced damage threshold were expatiated.The development of researches on the technologies and methods for laser damage resistance of optical films at home and abroad,which included ion beam pretreatment,ion beam or anneal treat-ment,pretest coating with the materials of high refractive index and so on,were analyzed.The pulsed laser deposition with mag-netic filter technology was emphasized in the expectation,and the atom layer deposition was advised to accelerate to develop, which supplied the theoretic base to improve the laser damage resistance of optical films to settle for current requirements.
Laser-Induced Damages to Charge Coupled Device Detector Using A High-Repetition-Rate and High-Peak-Power Laser

Li Gang,Shen Hong-bin,Li,Zhang Chu,Mao Shao-juan,Wang Yuan-bo

DOI: https://doi.org/10.1016/j.optlastec.2012.07.030

2013-01-01

Abstract:Lasers may cause dysfunction or even irreversible damage to a charge-coupled device (CCD). Based on a thermal damaging model for a CCD when its shading Al film is illuminated by a laser, the instant temperature field and thermal stress field of the light-shading Al film were calculated. We also set up an experimental system for causing laser-induced damages to CCDs with a high-repetition-rate and high-peak-power laser. We compared the damages under different laser operating illumination modes with numerical simulations and experiments. Compared with a high-repetition-rate laser or a high-peak-power laser alone, we found that a combination of a high-repetition-rate laser and a high-peak-power laser may cause more serious damages to CCDs.
Numerical Simulation of Pulsed Laser Induced Damage on CCD Arrays

姜楠,张雏,牛燕雄,沈学举,杨海林,陈燕,王龙,张博

DOI: https://doi.org/10.3969/j.issn.1001-5078.2008.10.012

2008-01-01

Abstract:CCD arrays can be disturbed or damaged when subjected to laser irradiation.The multilayer thermal-mechanical physical model of CCD irradiated by pulsed laser is set up based on heat conduction and thermal elastic mechanics theories,the heat conduction differential equation and stress-balance equation are solved by the finite elements method.The transient temperature field,thermal stress field and the most probably damaged position are obtained,with CCD pixel structure and operation mode presented,the influences of laser parameters and each damaged layer to CCD imaging formation are discussed as well.
Experimental study of 532nm pulsed laser irradiating CCD

Shen Hongbin,Shen Xueju,Zhou Bing,Mao Shaojuan,Jiang Nan,Li Gang

2009-01-01

High Power Laser and Particle Beams

Abstract:The array CCD is irradiated by a 532 nm,10 ns pulsed laser.According to the experiment phenomenon,hard damage process of CCD can be divided into 3 stages.In the first stage,when the CCD is irradiated by the laser with a low energy density,local white blind spots appears,which can not be recovered,while other parts of CCD can work normally.In the second stage,vertical bright white lines appear in the clock line direction of the light spot after irradiation,which can not work normally and can not be recovered by stopping irradiation.In the third stage,the CCD is damaged completely after being irradiated by the laser with a high energy density,and can not be recovered.Damaging mechanism of each stage is analyzed.Finally,aiming at the saturation and recovery stage of the CCD,the imaging of resolution target plate is processed with Matlab,and the influence on saturated elements and contrast of laser irradiation is analyzed.The result shows that,when CCD is irradiated by the laser,the number of saturated elements increases,and the contrast reduces to zero quickly.After the laser pulse disappears,the brightness of the whole CCD imaging reduces,and the number of saturated elements reduces to zero immediately.A moment later,the CCD returns to linear working region,and the higher the laser energy density is,the longer the recovery time is.It is found that when the recovery time is longer than 0.6 s,white stripes that can not be recovered appear,which influence imaging quality seriously.
Damaged effect on CCD detector irradiated by 500 fs laser pulse

Shao-yan HUANG,Yong-sheng ZHANG,Ben-qi TANG,Yong ZHANG,Zu-jun WANG,Zhi-gang XIAO

2005-01-01

High Power Laser and Particle Beams

Abstract:A 250 μJ,500 fs ultra-short laser pulse was used to radiate linear array CCD detector.The whole responding from linear, saturation,cross talk and totally damage was observed.Theoretical analyses were made to explain the damage mechanism.The experiment shows that the saturated energy threshold of CCD element is 0.45 μJ/cm~2.The CCD is damaged by six pulses with energy density of 0.14 J/cm~2 and the damage is due to lattice heat and evaporation with plasma.When the laser energy density is 1.41 J/cm~2,the output waveform of CCD detector is unrecognizable with single pulse and without any output with two pulses.The damage mechanism is considered to be coulomb force of electric field from charge separation.
Research of temperature field and thermal stress field of CCD under laser irradiation

Fan ZHANG,Yanxiong NIU,Ning LIU,Zhenjiang LIANG,Shuai LIU

DOI: https://doi.org/10.7510/jgjs.issn.1001-3806.2017.03.025

2017-01-01

Abstract:In order to study interaction process and damage mechanism between laser and CCD sensors,an interline transfer surface array CCD irradiated by 1.06μm CW laser was analyzed and simulated by means of finite element analysis.Thermal coupling model was established by using laser irradiation area of substrate Si surface as heat source.The temperature distribution and thermal stress distribution of CCD were simulated.By comparing and analyzing temperature damage and stress damage of the components,it was found that stress damage was prior to temperature damage.The results show that as the convergence of the fixed boundary and the free boundary,the thermal stress at the edge of the lower surface of the base Si is the first to exceed the damage threshold of 120MPa at the time of laser action of 0.1s,and stress failure occurs.Si material slips from the lower surface edge to the center,and the substrate is gradually out of fix.At the time of laser action of 0.3s,stress failure occurs to Al film and SiO2 film and Al film strips radically from the inside to the outside due to thermal stress over the adhesion strength of 100MPa,finally the CCD is out of work position and fails.The research achievements provide theoretical basis for laser damage and protection of CCD sensors.
Degradation Behavior and Damage Mechanisms of CCD Image Sensor With Deep-UV Laser Radiation

F.M. Li,N. O,A. Nathan

DOI: https://doi.org/10.1109/ted.2004.839758

IF: 3.1

2004-12-01

IEEE Transactions on Electron Devices

Abstract:As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial applications is shifting to intense DUV radiation sources. This trend necessitates the development of DUV sensitive charge-coupled device (CCD) cameras to provide imaging capability for process control and inspection purposes. In this paper, we examine the effects of DUV laser radiation on CCD image sensor characteristics and the mechanisms responsible for DUV laser damage in CCDs. When samples of thinned front-illuminated linescan CCD sensors are exposed to $F _{2}(\lambda=157~{\rm nm})$ excimer laser radiation, fluctuation in the extrinsic quantum efficiency (QE) and a substantial upsurge in the dark current density are observed as a function of exposure dose. The visible QE, dark current, and charge conversion efficiency (CCE) are also permanently altered by the DUV irradiation. These instabilities can be attributed to a variety of UV-induced effects that modify the optical and electrical properties of the ${\hbox {SiO}}_{2}$ layer and Si-${\hbox {SiO}}_{2}$ interface, resulting in temporary and permanent shifts in CCD performance. Optimization of the overlying oxide thickness and the Si-${\hbox {SiO}}_{2}$ interface quality are necessary in order to realize CCD sensors with the desired performance, radiation tolerance and stability at DUV wavelengths.

engineering, electrical & electronic,physics, applied
Multi-wavelength coupling effect of laser-induced defect damage in beam splitter films captured by a three-dimensional spatially and temporally resolved method

Chong Shan,Xiaohui Zhao,Yanqi Gao,Yuanan Zhao,Daxing Rao,Yong Cui,Cheng Li,Guohang Hu,Weixin Ma,Zhan Sui,Jianda Shao

DOI: https://doi.org/10.1016/j.optlastec.2020.106368

2020-10-01

Abstract:<p>In this paper, we propose a three-dimensional spatially and temporally resolved method for measuring laser-induced damage fluence by identifying the time onset of defect damage and the damage location in the three-dimensional coordinate system of a Gaussian beam. When considering a second-harmonic beam splitter as an example, the defect fluence of fundamental wave (1064 nm) and second harmonic wave (532 nm) simultaneous irradiation is captured accurately by the proposed method. The defect damage threshold of a second-harmonic beam splitter and the coupling effect between multi-wavelength lasers during defect damage initiation are investigated. Our test method can not only identify complex multi-wavelength laser coupling damage mechanisms that traditional test methods cannot observe, but also provides a new method for obtaining accurate defect information for optical films, which is helpful for improving the laser resistance ability of optical films.</p>

optics,physics, applied
Mechanism Analysis and Experiment Simulation on Radiation Effects of CCDs

TANG Ben-qi,XIAO Zhi-gang,WANG Zu-jun,ZHANG Yong,HUANG Shao-yan,LIU Min-bo,ZHOU Hui,CHEN Wei

DOI: https://doi.org/10.3321/j.issn:0372-2112.2007.08.012

2007-01-01

Abstract:It is analyzed about the damage mechanism of ionization and displacement radiation on CCDs,The physical model and the numerical processing method are set up about a buried channel CCD,which has been used to simulate the dynamic transfer process of CCD with the three phrases pulse driver by semiconductor device simulator MEDICI.It is also calculated on the charge transfer efficiency of CCDs irradiated by 1MeV and 14MeV neutrons.An offline measure system is designed for radiation damage effects on linear CCDs based on CPLD.The experiments of ionization and displacement radiation effects are carried out on the commercial linear CCD by Co-60γ source and neutron pulse from Xi'an Pulse Reaction with our self-designed test system,and get some valuable results of dark voltage and saturation voltage and charge transfer efficiency and cells inequality varied with total dose and neutron fluence for the devices.
Laser-induced Damage in a Silicon-Based Photodiode by MHz Picosecond Laser

Kaixuan Wang,Xuyang Yu,Pingxue Li,Tingting Wang,Yuefei Zhang,Chunyong Li

DOI: https://doi.org/10.1088/1555-6611/ab92aa

IF: 1.2

2020-01-01

Laser Physics

Abstract:Study of the damage characteristics of silicon-based photodetectors is of great significance in improving application performance, but few studies of laser-induced damage have been undertaken on photodetectors irradiated by hundred-ps fiber lasers. In this work, we demonstrate an all-fiber ps-pulsed laser system which outputs a pulse width of 226.5 ps and an average power of 20 W at 2.4 MHz repetition rate, with high beam quality and pulse stability. Experiments use this fiber amplifier to irradiate a silicon-based positive–intrinsic–negative (PIN) photodiode. The changes in detector performance and surface morphology are confirmed by systematic experiments on the laser-irradiated detector. The results show that detection performance was sensitive to laser energy, and the failure damage threshold was about 864 kW cm−2. Based on hydrodynamics theory, we simulated the laser-induced plasma density distribution in a PIN photodiode and studied the thermal and plasma damage mechanisms in the PIN photodiode.
Study on threshold of laser damage to CCD and CMOS image sensors

LIN Jun-Yang,Rong Shu,HUANG Geng-Hua,FANG Kang-Mei,YAN Zhi-Xin

DOI: https://doi.org/10.3321/j.issn:1001-9014.2008.06.018

2008-01-01

JOURNAL OF INFRARED AND MILLIMETER WAVES

Abstract:Theoretical analyses and experimental research were done on the laser-induced interference and damage to CCD and CMOS image sensors. The 1064 nm laser interference threshold, damage threshold and completely destroy threshold of CCD and CMOS image sensors were measured under atmospheric pressure condition and vacuum condition respectively. Experimental results show that the three aforementioned thresholds of CCD or CMOS sensors have no obvious differences Under the two different pressure conditions. Experimental results also reveal that, compared to CMOS image sensors, CCD image sensors are easier to he interfered or damaged or even destroyed, while CMOS sensors have a better anti-jamming and anti-injury ability under each of the two conditions.
Dazzling Evaluation of the Impact of a High-Repetition-Rate CO2 Pulsed Laser on Infrared Imaging Systems

Hanyu Zheng,Yunzhe Wang,Yang Liu,Tao Sun,Junfeng Shao

DOI: https://doi.org/10.3390/s24061827

2024-03-12

Abstract:This article utilizes the Canny edge extraction algorithm based on contour curvature and the cross-correlation template matching algorithm to extensively study the impact of a high-repetition-rate CO2 pulsed laser on the target extraction and tracking performance of an infrared imaging detector. It establishes a quantified dazzling pattern for lasers on infrared imaging systems. By conducting laser dazzling and damage experiments, a detailed analysis of the normalized correlation between the target and the dazzling images is performed to quantitatively describe the laser dazzling effects. Simultaneously, an evaluation system, including target distance and laser power evaluation factors, is established to determine the dazzling level and whether the target is recognizable. The research results reveal that the laser power and target position are crucial factors affecting the detection performance of infrared imaging detector systems under laser dazzling. Different laser powers are required to successfully interfere with the recognition algorithm of the infrared imaging detector at different distances. And laser dazzling produces a considerable quantity of false edge information, which seriously affects the performance of the pattern recognition algorithm. In laser damage experiments, the detector experienced functional damage, with a quarter of the image displaying as completely black. The energy density threshold required for the functional damage of the detector is approximately 3 J/cm2. The dazzling assessment conclusions also apply to the evaluation of the damage results. Finally, the proposed evaluation formula aligns with the experimental results, objectively reflecting the actual impact of laser dazzling on the target extraction and the tracking performance of infrared imaging systems. This study provides an in-depth and accurate analysis for understanding the influence of lasers on the performance of infrared imaging detectors.
Non-destructive evaluation of UV pulse laser-induced damage performance of fused silica optics

Jin Huang,Fengrui Wang,Hongjie Liu,Feng Geng,Xiaodong Jiang,Laixi Sun,Xin Ye,Qingzhi Li,Weidong Wu,Wanguo Zheng,Dunlu Sun

DOI: https://doi.org/10.1038/s41598-017-16467-2

IF: 4.6

2017-01-01

Scientific Reports

Abstract:The surface laser damage performance of fused silica optics is related to the distribution of surface defects. In this study, we used chemical etching assisted by ultrasound and magnetorheological finishing to modify defect distribution in a fused silica surface, resulting in fused silica samples with different laser damage performance. Non-destructive test methods such as UV laser-induced fluorescence imaging and photo-thermal deflection were used to characterize the surface defects that contribute to the absorption of UV laser radiation. Our results indicate that the two methods can quantitatively distinguish differences in the distribution of absorptive defects in fused silica samples subjected to different post-processing steps. The percentage of fluorescence defects and the weak absorption coefficient were strongly related to the damage threshold and damage density of fused silica optics, as confirmed by the correlation curves built from statistical analysis of experimental data. The results show that non-destructive evaluation methods such as laser-induced fluorescence and photo-thermal absorption can be effectively applied to estimate the damage performance of fused silica optics at 351 nm pulse laser radiation. This indirect evaluation method is effective for laser damage performance assessment of fused silica optics prior to utilization.
In-situ Laser-Induced Surface Damage Inspection Based on Image Super-Resolution and Adaptive Segmentation Method

Fengdong Chen,Jingyang Sun,Qian Wang,Hongbo Zhu,Fa Zeng,Yueyue Han,Cheng Lu,Guodong Liu

DOI: https://doi.org/10.3788/col202220.071101

IF: 2.56

2022-01-01

Chinese Optics Letters

Abstract:In-situ laser-induced surface damage inspection plays a key role in protecting the large aperture optics in an inertial confinement fusion (ICF) high-power laser facility. In order to improve the initial damage detection capabilities, an in-situ inspection method based on image super-resolution and adaptive segmentation method is presented. Through transfer learning and integration of various attention mechanisms, the super-resolution reconstruction of darkfield images with less texture information is effectively realized, and, on the basis of image super-resolution, an adaptive image segmentation method is designed, which effectively adapts to the damage detection problems under conditions of uneven illumination and weak signal. An online experiment was carried out by using edge illumination and the telescope optical imaging system, and the validity of the method was proved by the experimental results.
Study on Numerical Analysis and Experiment Simulation Approaches for Radiation Effects of Typical Optoelectronic Devices

Ben-qi TANG,Yong ZHANG,Zhi-gang XIAO,Fang HUANG,Zu-jun WANG,Shao-yan HUANG,Yong-ze MAO,Feng WANG

DOI: https://doi.org/10.3969/j.issn.1000-6931.2005.02.019

2005-01-01

Abstract:The numerical analysis and experimental simulation approaches were studied for radiation effects of typical optoelectronic devices, such as Si solar cells and CCDs. At first, the damage mechanism of ionization and displacement effects on solar cells and CCDs was analyzed. Secondly, the output characteristics of Si solar cell by 1 MeV electron radiation was calculated with the two-dimensional device simulation software MEDICI, such as the short circuit current I_(sc), the open-circuit voltage V_(oc) and the maximum power P_(max). The simulation results are in good agreement with the experimental values in a certain range of electron fluence. Meanwhile, the ionization radiation experiment was carried out on the commercial linear CCD by ~(60)Co γ source with our self-(designed) test system, and some valuable results of dark voltage and saturation voltage (varied) with total dose for TCD132D were gotten.
Analysis of the Displacement Damage Mechanism of Radiation Effects in CCD

WANG Zujun,HUANG Shaoyan,LIU Minbo,TANG Bengqi,XIAO Zhigang,ZHANG Yong,CHEN Wei,LIU Yinong

DOI: https://doi.org/10.16818/j.issn1001-5868.2010.02.003

2010-01-01

Abstract:The displacement damage mechanism of radiation effects in charge coupled devices(CCD) is researched. It is analyzed that the displacement radiation damage induces the generation of bulk defects which degrade the performance of CCD. Displacement radiation damage induces the decrease of charge transfer efficiency, the increase of the bulk dark current , and the generation of dark current spikes and random telegraph signal(RTS).
Combined non-destructive evaluation of the damage precursors in fused silica optics

Han Gu,LIN YAO,Chengcheng Wang,LIMING YANG,Taixiang Liu,Hongwei Yan,XIaodong Jiang,Xiang Geng,Honghong Wu,jin huang,Li Li

DOI: https://doi.org/10.1364/oe.529872

IF: 3.8

2024-08-22

Optics Express

Abstract:Han Gu, Lin Yao, Chengcheng Wang, Liming Yang, Taixiang Liu, Hongwei Yan, Xiaodong Jiang, Xiang Geng, Honghong Wu, Li Li, Jin Huang Combined non-destructive evaluation methods for fused silica's damage precursors including UV photothermal weak absorption, ... [Opt. Express 32, 31849-31865 (2024)]

optics
Analysis on the crosstalk saturation phenomenon of CCD during the detecting process

SUN Jing,LIU Guodong,DU Lifeng,ZHANG Rongzhu

DOI: https://doi.org/10.13741/j.cnki.11-1879/o4.2013.06.010

2013-01-01

Optical Technique

Abstract:In order to validate the crosstalk saturation when laser irradiating CCD system,aphysical model of crosstalk saturation when single and double laser irradiating CCD system is built up.The relation curve of incident energy density and saturated CCD pixel number is achieved and experimentally verified.The theoretical and experimental results demonstrate that the relationship between incident laser energy density and saturated CCD area is nonlinear.When two light beams irradiate the CCD at the same time,increase of the incident energy density of one light beam will disturb the detection effect of another light beam.
Non-blind Super-Resolution Reconstruction for Laser-Induced Damage Dark-Field Imaging of Optical Elements

Qian Wang,Fengdong Chen,Yueyue Han,Fa Zeng,Cheng Lu,Guodong Liu

DOI: https://doi.org/10.3788/col202422.041101

IF: 2.56

2024-01-01

Chinese Optics Letters

Abstract:The laser-induced damage detection images used in high-power laser facilities have a dark background, few textures with sparse and small-sized damage sites, and slight degradation caused by slight defocus and optical diffraction, which make the image superresolution(SR) reconstruction challenging. We propose a non-blind SR reconstruction method by using an exquisite mixing of high-, intermediate-, and low-frequency information at each stage of pixel reconstruction based on UNet. We simplify the channel attention mechanism and activation function to focus on the useful channels and keep the global information in the features. We pay more attention on the damage area in the loss function of our end-toend deep neural network. For constructing a high-low resolution image pairs data set, we precisely measure the point spread function(PSF) of a low-resolution imaging system by using a Bernoulli calibration pattern; the influence of different distance and lateral position on PSFs is also considered. A high-resolution camera is used to acquire the ground-truth images, which is used to create a low-resolution image pairs data set by convolving with the measured PSFs. Trained on the data set, our network has achieved better results, which proves the effectiveness of our method.
Multiple physical modeling for damage mechanism of high energy laser weapon

Naiqiu SONG,Haochun ZHANG,Chao MAO,Yang ZHAO,Yanqiang WEI

DOI: https://doi.org/10.11949/j.issn.0438-1157.20160612

2016-01-01

Abstract:The research on damage mechanism of high energy laser weapon is the basis for evaluating the damage effect.Based on the damage mechanism of the high-energy laser weapon,effect of thermal damage,mechanical damage and radiation damage by laser irradiation were investigated.Considering the surface state of different materials under laser irradiation,two models as steady state and unsteady state were established respectively.Moreover,numerical simulation was performed to evaluate the influence of tangential flow.In addition,the energy utilization efficiency of laser irradiation was discussed,and the effect of different materials on the laser protection was also compared.The results of the current can provide theoretical basis for laser damage assessment.

Damage effect evaluation of CCD irradiated by laser based on multi-source information fusion

Researches on Laser Damage Resistance of Optical Films

Laser-Induced Damages to Charge Coupled Device Detector Using A High-Repetition-Rate and High-Peak-Power Laser

Numerical Simulation of Pulsed Laser Induced Damage on CCD Arrays

Experimental study of 532nm pulsed laser irradiating CCD

Damaged effect on CCD detector irradiated by 500 fs laser pulse

Research of temperature field and thermal stress field of CCD under laser irradiation

Degradation Behavior and Damage Mechanisms of CCD Image Sensor With Deep-UV Laser Radiation

Multi-wavelength coupling effect of laser-induced defect damage in beam splitter films captured by a three-dimensional spatially and temporally resolved method

Mechanism Analysis and Experiment Simulation on Radiation Effects of CCDs

Laser-induced Damage in a Silicon-Based Photodiode by MHz Picosecond Laser

Study on threshold of laser damage to CCD and CMOS image sensors

Dazzling Evaluation of the Impact of a High-Repetition-Rate CO2 Pulsed Laser on Infrared Imaging Systems

Non-destructive evaluation of UV pulse laser-induced damage performance of fused silica optics

In-situ Laser-Induced Surface Damage Inspection Based on Image Super-Resolution and Adaptive Segmentation Method

Study on Numerical Analysis and Experiment Simulation Approaches for Radiation Effects of Typical Optoelectronic Devices

Analysis of the Displacement Damage Mechanism of Radiation Effects in CCD

Combined non-destructive evaluation of the damage precursors in fused silica optics

Analysis on the crosstalk saturation phenomenon of CCD during the detecting process

Non-blind Super-Resolution Reconstruction for Laser-Induced Damage Dark-Field Imaging of Optical Elements

Multiple physical modeling for damage mechanism of high energy laser weapon