Electrical performance of monolayer MoS2 field-effect transistors prepared by chemical vapor deposition

Matthew L. Chin, A.Glen Birdwell, Terrance P. ORegan, Sina Najmaei, Zheng Liu, Pulickel M. Ajayan, Jun Lou, Madan Dubey
2013-04-23
Abstract:Molybdenum disulfide (MoS 2) field effect transistors (FET) were fabricated on atomically smooth large-area single layers grown by chemical vapor deposition. The layer qualities and physical properties were characterized using high-resolution Raman and photoluminescence spectroscopy, scanning electron microscopy, and atomic force microscopy. Electronic performance of the FET devices was measured using field effect mobility measurements as a function of temperature. The back-gated devices had mobilities of 6.0 cm 2/V s at 300 K without a high-κ dielectric overcoat and increased to 16.1 cm 2/V s with a high-κ dielectric overcoat. In addition the devices show on/off ratios ranging from 10 5 to 10 9.
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