The electrical characterization of V2O5/p-Si prepared by spray pyrolysis technique using perfume atomizer

Veysel Eratilla,Serif Ruzgar
DOI: https://doi.org/10.1007/s12648-024-03424-9
2024-09-19
Indian Journal of Physics
Abstract:Vanadium pentoxide (V 2 O 5 ) thin films were deposited onto glass and p-type silicon substrates via spray pyrolysis by using a perfume atomizer. The surface morphology of thin film was analyzed by atomic force microscopy. Structural and optical characteristics of the deposited thin films were assessed through X-ray diffraction and UV–Vis spectroscopy, respectively. The V 2 O 5 thin films were determined to be polycrystalline in nature, exhibiting a band gap of 2.20 eV. The semiconductor properties of V 2 O 5 thin films deposited on glass substrates were investigated through electrical measurements conducted by using a two-probe system across a range of temperatures. Key electrical parameters such as sheet resistance, conductivity, and activation energy were deduced from these measurements. Furthermore, the electrical characteristics of the Ag/V 2 O 5 /p-Si heterojunctions were scrutinized via current–voltage (I–V) and capacitance–voltage (C–V) analyses, which exhibited pronounced rectifying behavior in the Ag/V 2 O 5 /p-Si device structure.
physics, multidisciplinary
What problem does this paper attempt to address?