Improved passivation performance of Al2O3 interlayer/MoOX thin films continuously grown via atomic layer deposition

Minji Jeong,Jihye Park,Young Joon Cho,Hyo Sik Chang
DOI: https://doi.org/10.1016/j.tsf.2022.139667
IF: 2.1
2023-02-01
Thin Solid Films
Abstract:Atomic-layer-deposited MoOx was investigated as a hole-selective layer in Si heterojunction solar cells. MoOx grown on Si through atomic layer deposition (ALD) produce numerous sub-oxidation states at the MoOx/Si interface. The passivation of interface states remains an important problem for hole-selective contact Si solar cells. We improved the passivation of interface defects in the ALD-MoOx/Si structure by introducing ultrathin ALD-Al2O3 at 443 K for continuous processing with ALD-MoOx. Consequently, the carrier lifetime and implied open-circuit voltage increased from 22 μs to 215 μs and 568 mV to 637 mV, respectively. The introduction of ultrathin ALD-Al2O3 significantly reduced the number of oxidation states that acted as defects. The best passivation was observed up to 907 μs and 676 mV after post-deposition annealing at 623 K. The ALD-MoOX film prepared by introducing ultrathin Al2O3 is a promising hole-selective contact layer.
materials science, multidisciplinary,physics, applied, condensed matter, coatings & films
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