Development of Molding Compounds Based on Epoxy Resin/Aromatic Amine/Benzoxazine for High‐Temperature Electronic Packaging Applications

Haolan Gou,Ying Bao,Jiateng Huang,Xiaoma Fei,Xiaojie Li,Wei Wei
DOI: https://doi.org/10.1002/mame.202200351
2022-07-03
Macromolecular Materials and Engineering
Abstract:Molding compounds with superior high‐temperature stability is an indispensable part in encapsulating future electronic power devices working at high temperatures (above 200°C). Herein, we used polyfunctional epoxy resin (EP) and diamine‐phenol benzoxazine (BOZ) as resin matrix, 4,4'‐diaminodiphenylmethane (DDM) as curing agent, and iron acetylacetonate (Fe(acac)3) as curing accelerator, as well as inorganic fillers and other auxiliaries, to prepare a heat‐resistant molding compound. The curing behavior and processability of the EP/DDM/BOZ (EDB) resin blends containing different contents of DDM, BOZ and Fe(acac)3 were first systematically investigated, as well as the thermal performance of the cured products. The curing mechanism and cross‐linking network of the resin matrix were further determined. The EDB molding compounds (MCEDB) with suitable BOZ content showed good processability, and the molding process could be compatible well with that of commercial epoxy molding compounds (EMC). With increasing the BOZ content, although the crosslinking density of the cured resin matrix of MCEDB decreased gradually as compared with that of EMC, the glass transition temperature of MCEDB was greatly enhanced to a maximum of 261°C determined by DMA, owing to the hydrogen‐bond interaction generated after polymerization of BOZ increasing the rigidity of network chains. Moreover, the cured MCEDB also exhibited higher thermal decomposition stability, better high‐temperature (200°C) mechanical properties, and lower water absorption compared to the cured EMC. After high‐temperature (200°C) aging for 500 h, the cured MCEDB with suitable BOZ content still maintained outstanding performance. This study reveals that MCEDB is a promising candidate as heat‐resistant electronic packaging molding compounds for future high‐power devices. This article is protected by copyright. All rights reserved
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