Drain-extended MOS design using High-k dielectric to control off-state BTBT with enhanced switching performance

Shraddha Pali,Pragyey Kumar Kaushik,Ankur Gupta
DOI: https://doi.org/10.1088/2631-8695/ac8147
IF: 1.7
2022-07-16
Engineering Research Express
Abstract:This work explores the application of high-k dielectric to suppress off-state band-to-band tunnelling (BTBT) and enhance the switching performance of conventional Drain-extended NMOS (C_DeNMOS). C_DeNMOS switching performance is limited by extended gate over the drift region, while the high field effects near the gate edge are responsible for BTBT below the gate-to-drain overlap region. We investigate two improved configurations of DeNMOS 1) Planar and 2) Trench structures incorporating a floating plate (FP). In comparison to C_DeNMOS, it is demonstrated that employing high-k dielectric HfO 2 with appropriately doped FP in the Planar and Trench structures can efficiently modulate the surface field while also reducing surface charge accumulation. As a result, BTBT is suppressed in Planar and Trench structures when HfO 2 is used as dielectric, in addition to improvement in switching delay, reverse recovery behavior, and switching energy performance at higher operating frequencies.
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