Speed enhancement and kickback noise reduction in single-stage latched comparator improved for high-speed and low-noise analogue-to-digital converters

S. Kazeminia,O. Shino,E. Haghighi,K. Hadidi
DOI: https://doi.org/10.1080/21681724.2015.1092592
2015-10-05
International Journal of Electronics Letters
Abstract:In the proposed high-speed comparator, the common mode level of the output voltages is preserved unchanged during pre-amplification and latch operations to enhance the comparison speed. Second, in the proposed low-noise comparator, operations are scheduled by two reduced amplitude signals, around 0.6 V instead of 3.3 V, to alleviate the coupling noise of digital control signals. Simulation results confirm that a 5 mV input difference can be simply detected at 800 MS/s and 500 MS/s update rate, in high-speed and low-noise comparators, respectively. Hence, about 60% improvement is realised in speed of the conventional structure. Moreover, input-referred kickback is reduced from 12 mV to less than 100 µV in low-noise version. High-speed and low-noise comparators consume around 780 µW and 650 µW at maximum allowable update rate in 288 µm2 and 480 µm2 active areas, respectively. Applying 8 mV offset voltage on input devices of differential pair and 75 ps peak-to-peak jitter on control signals guarantee more than 7-bits resolution, for peak-to-peak reference voltage of 1.6 V. Monte-Carlo analysis is also presented applying absolute variations of around ±10 mV on threshold voltage of complementary metal-oxide-semiconductor (CMOS) devices. Simulations are performed using the BSIM3 model of transistors in a 0.35 µm CMOS technology.
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