Development of Calibration Source for Dynamic Contact Resistance Tester of Conductive Ring Based on Time-Varying Resistance

Ming Yan,Congru Yin,Yue He,Tiantian Li
DOI: https://doi.org/10.1109/icemi52946.2021.9679587
2021-10-29
Abstract:The conductive ring dynamic contact resistance tester is a necessary instrument and equipment in many fields, such as national defense and military industry. Based on the research of the working principle and measurement characteristics of the conductive ring dynamic contact resistance tester, this paper proposed that the calibration parameters are incomplete when the DC resistance box is used for calibration. In response to this problem, this paper proposed a time-varying resistance standard as a calibration source. The calibration source is controlled by the timing module. The constant current active adjustable resistance generation module outputs the resistance at a timing. The resistance change rate is 10ksa/s and the resistance output range is from 10mΩ to 100Ω. It can realize the full parameter calibration of resistance parameters and sampling rate parameters of the conductive ring dynamic contact resistance tester, ensuring the quality control of this kind of equipment.
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