RF Modeling of FDSOI Transistors Using Industry Standard BSIM-IMG Model

Pragya Kushwaha,Sourabh Khandelwal,Juan Pablo Duarte,Chenming Hu,Yogesh Singh Chauhan
DOI: https://doi.org/10.1109/tmtt.2016.2557327
IF: 4.3
2016-06-01
IEEE Transactions on Microwave Theory and Techniques
Abstract:In this paper, RF modeling and step-by-step parameter extraction methodology of the BSIM-IMG model are discussed with experimental data. BSIM-IMG is the latest industry standard surface potential based model for fully depleted silicon-on-insulator (FDSOI) transistors. The impact of gate, substrate, and thermal networks is demonstrated with S-parameter data, which enable the BSIM-IMG model to capture RF behavior of the FDSOI transistor. The model is validated over a wide range of biases and frequencies and excellent agreement with the experimental data is obtained.
engineering, electrical & electronic
What problem does this paper attempt to address?