Electron microscope study of electrodeposited Ni films in the 0.1–50 μ range

I. Gündiler,L. E. Murr
DOI: https://doi.org/10.1116/1.568666
1975-07-01
Journal of Vacuum Science and Technology
Abstract:Structural changes in the thin film–thick film transition of Ni, electrodeposited onto polycrystalline copper substrates, were observed. Nickel was plated onto electropolished substrates from a Watts bath held at 50 °C at a current density of 1 mA/cm2. The Cu substrates, chemically stripped from the thick Ni deposits, were subsequently electrolytically thinned to prepare transmission electron microscope (TEM) specimens. Scanning electron microscope (SEM) observations were made on the Ni deposits before stripping. Epitaxial growth was observed in deposits of 0.1-μ thickness, with traces of polycrystallinity. Deposits acquired a relatively uniform polycrystalline grain structure at about 5-μ thickness, and only slight increases in grain size were observed with increased thickness above 5 μ.
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