Superconducting niobium nitride thin films deposited by metal organic plasma-enhanced atomic layer deposition

Mario Ziegler,Ludwig Fritzsch,Julia Day,Sven Linzen,Solveig Anders,Julia Toussaint,Hans-Georg Meyer
DOI: https://doi.org/10.1088/0953-2048/26/2/025008
2012-12-18
Superconductor Science and Technology
Abstract:Superconducting NbNx thin films were deposited by plasma-enhanced atomic layer deposition (PEALD) using the metal organic precursor (tert-butylimido)-tris (diethylamino)-niobium (TBTDEN) and hydrogen plasma. The transition temperature TC and the resistivity of the NbN thin films were measured by four-point probe measurement. Their composition was analyzed by x-ray diffraction and Rutherford backscattering spectroscopy. The deposition process was optimized to obtain a low resistivity as well as a high superconducting transition temperature. A TC close to 10 K and a resistivity of 2.5 μΩ m as well as a critical current density of 8.9 × 105 A cm−2 were achieved. Originally, a high oxygen concentration was detected in the compound. By variation of the plasma parameters, the concentration could be reduced from 57 atom (at.)% to 11 at.%. Because of the excellent thickness control and conformality, such ALD films may be suited very well for applications in superconductor electronics and sensing devices.
physics, condensed matter, applied
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