Formation of monocrystalline silicon nanowires using low-energy ion irradiation

B. A. Gurovich,K. E. Prikhod’ko,D. A. Komarov,A. N. Taldenkov
DOI: https://doi.org/10.1134/s1995078013020079
2013-03-01
Nanotechnologies in Russia
Abstract:In this work we have proposed a technique which can be used to fabricate monocrystalline silicon nanowires on a silicon wafer surface by forming specially designed extended structures with a negative slope angle of side walls and their subsequent oxidation by irradiation with low-energy oxygen ions at a temperature of 400°C. The shape and sizes of the structures were chosen first so that the process of oxidation would not modify the central part of the nanowire and keep the monocrystallinity and doping level of the initial silicon and, second, to provide the electrical insulation of the nanowire from the wafer. The dependence of the oxidation depth on the temperature and duration of plasma irradiation as well as the electrical properties of the resulting oxide are studied.
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