High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices

Pierre Eyben

DOI: https://doi.org/10.3762/bjnano.4.35

IF: 3.1

2013-05-16

Beilstein Journal of Nanotechnology

Abstract:High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology

What problem does this paper attempt to address?

Coherent Vibrational Spectroscopy of Electrochemical Interfaces with Plasmonic Nano-gratings.

Zhihua Liu,Ying Li,Qian Xu,Hongqing Wang,Wei-Tao Liu

DOI: https://doi.org/10.1021/acs.jpclett.9b02985

2020-01-01

Abstract:The fundamental understanding of electrochemistry urges accurate knowledge of all interfacial properties at the molecular level, but the retrieval of such information is a real challenge. Optical spectroscopies facilitated by surface plasmon enhancement can shed light on this field, yet past studies relied on either highly inhomogeneous "hot spots" or planar plasmon modes with limited enhancement. Here we report an in situ sum-frequency vibrational spectroscopy scheme using plasmonic nanogratings, which enable strong, coherent surface plasmon excitation even on planar electrodes. With two classical reactions, the gold oxidation and pyridine adsorption in water, we demonstrate the realization of coherent vibrational spectroscopy in the strong absorption region, revealing the polar orientation and ordering of interfacial species that are crucial toward the mechanistic understanding of electrochemical phenomena.
High-Resolution Transmission Electron Microscopy Imaging Of Carbon Nanostructures

Kazu Suenaga,Yuta Sato,Zheng Liu,Masanori Koshino,Chuanhong Jin

2012-01-01

Abstract:Here we show how a high-resolution transmission electron microscopy can be applied to characterize the carbon nanostructures. Direct imaging of the hexagonal network of carbon nanotube enables us to determine the chiral index and to visualize the topological defects, such as pentagons and heptagons. Individual molecular imaging has also become possible, and atomic structure of fullerene molecules (C-60 and C-80) has been successfully identified at a single-molecular basis. Some recent progress for in situ observation of the carbon nanotube/fullerene growth and the defect dynamics is also presented.
Nanoscale Imaging of Surface Topography and Reactivity with the Scanning Electrochemical Microscope

Francois O. Laforge,Jeyavel Velmurugan,Yixian Wang,Michael V. Mirkin

DOI: https://doi.org/10.1021/ac900335c

IF: 7.4

2009-01-01

Analytical Chemistry

Abstract:Over the last 2 decades, scanning electrochemical microscopy (SECM) has been extensively employed for topographic imaging and mapping surface reactivity on the micrometer scale. We used flat, polished nanoelectrodes as SECM tips to carry out feedback mode imaging of various substrates with nanoscale resolution. Constant-height and constant-current images of plastic and Au compact disc surfaces and more complicated objects (computer chips and wafers) were obtained. The possibility of simultaneous imaging of surface topography and electrochemical reactivity was demonstrated. Very fast mass transfer at nanoelectrodes allowed us to obtain high-quality electrochemical images in viscous media under steady-state conditions, e.g., in 1-methyl-3-octylimidazolium-bis(tetrafluoromethylsulfonyl)imide (C(8)mimC(1)C(1)N) ionic liquid. Ion-transfer-based imaging was also performed using nanopipets as SECM tips.
Advanced Characterization Methods for Electrical and Sensoric Components and Devices at the Micro and Nano Scales

Evgeniya Sheremet,Peter Meszmer,Thomas Blaudeck,Susanne Hartmann,Christian Wagner,Bing Ma,Sascha Hermann,Bernhard Wunderle,Stefan E. Schulz,Michael Hietschold,Raul D. Rodriguez,Dietrich R. T. Zahn

DOI: https://doi.org/10.1002/pssa.201900106

2019-07-22

physica status solidi (a)

Abstract:This feature article covers the nano‐analysis methods for four key material characteristics: electrical and electronic properties, optical, stress and strain, and chemical composition. With the downsizing of the geometrical dimensions of electronic, optoelectronic, and electromechanical devices from the micro to the nanoscale at the one hand and the increase of functionality density at the other, the previous generation of micro‐analysis methods is no longer sufficient. Therefore, the metrology of materials' properties with nanoscale resolution has become prerequisite in materials research and development. The article shortly reviews the standard analysis methods and focuses on advanced methods with a nanoscale spatial resolution based on atomic force microscopy (AFM): current‐sensing AFM (CS‐AFM), Kelvin probe force microscopy (KPFM), and hybrid optical techniques coupled with AFM including tip‐enhanced Raman spectroscopy (TERS), photothermal‐induced resonance (PTIR) characterization methods (nano‐Vis, nano‐IR), photo‐induced force microscopy (PIFM) and photothermal microspectroscopy (PTMS). The simultaneous acquisition of multiple parameters (topography, charge and conductivity, stress and strain, chemical composition) at the nanoscale is a key for exploring new research on structure‐property relationships of nanostructured materials such as carbon nanotubes (CNTs) and nano/microelectromechanical systems (N/MEMS). Advanced nanocharacterization techniques foster the design and development of new functional materials for flexible hybrid and smart applications.This article is protected by copyright. All rights reserved.
Investigation of Interface Effect of Nanoscale Devices

EF Liu,P Bai,EP Li

DOI: https://doi.org/10.1109/nano.2003.1231011

2003-01-01

Abstract:Electronic transport in molecular devices is carefully studied, especially the interface effect, which is considered as a key factor for dominating device characteristics. Conductance of device show oscillates when the separation distance between molecule and electrodes changes. This implies that a closer contact do not always lead to a better characteristics of device, such as current-voltage (I-V) characteristics. Moreover, the effect of different size of electrodes of a more complex device is also examined.
New Developments in Nanotechnology Research

Eugene V. Dirote,Jeannette Garcia,Subrata Saha,D. Chakravorty,Marta Mas‐Torrent,Yang De-ren,Zhihong Liu,X.-S. Wang,Yude Wang,S. Chowdhury,D. Beegan,M. T. Laugier,Lucia Scaffardi,Jorge O. Tocho,J.C. Jiménez-Sáez

2007-01-01

Abstract:Surface Magnetic Properties and Magnetoimpedance in Metallic Glasses for New Sensor Applications One Dimensional Organic Conductors Organic Field-Effect Transistors: Tetrathiafulvalene Derivatives as Highly Promising Organic Semiconductors One-Dimensional Nanostructures of Silicon: Synthesis, Characterisation and Applications Diamond and Three Dimensional Nanoimprint Lithography A Comparative Study of Al, Ge and Sb Self-Assembled Nanostructures on Graphite Self-Assembled Synthesis and Optical Properties of the new Ordered Lamellar Mesostructured Inorganic-Organic Nanocomposites Nanoindentation Hardness Study of Copper Thin Films Deposited by RF Magnetron Sputtering on Oxidised Silicon Substrates Size Effects on the Optical Properties of Metal Nanoparticles: Applications to Sizing by Analysis of Extinction Spectra Structural Changes in Metallic Nanoclusters Deposited on Substrates with Much Larger Lattice Parameters Index.
Electron Microscopy and Diffraction of Crystalline Dendrimers and Macrocycles

CJ BUCHKO,PM WILSON,Z XU,J ZHANG,JS MOORE,DC MARTIN

DOI: https://doi.org/10.1016/0032-3861(95)90927-t

IF: 4.6

1995-01-01

Polymer

Abstract:The precisely defined geometry of phenylacetylene dendrimers and macrocycles makes it possible to investigate systematic variations in chemical architecture on the nature of microstructural organization. Here we report on transmission electron microscopy, selected-area electron diffraction and high-resolution electron microscopy studies of crystalline phases of these synthetic materials. Since the molecules are sensitive to electron beam damage, low-dose techniques were used to capture images and diffraction patterns dynamically. The data show increased crystal misorientation with increasing side-group length and molecular complexity. As the size increases, the number of conformations available to the molecule also increases, making it difficult to pack the molecules with fewer defects.
Imaging and quantifying the morphology of an organic-inorganic nanoparticle at the sub-nanometre level

Matti M van Schooneveld,Alexandre Gloter,Odile Stephan,Luiz F Zagonel,Rolf Koole,Andries Meijerink,Willem J M Mulder,Frank M F de Groot

DOI: https://doi.org/10.1038/nnano.2010.105

Abstract:The development of hybrid organic-inorganic nanoparticles is of interest for applications such as drug delivery, DNA and protein recognition, and medical diagnostics. However, the characterization of such nanoparticles remains a significant challenge due to the heterogeneous nature of these particles. Here, we report the direct visualization and quantification of the organic and inorganic components of a lipid-coated silica particle that contains a smaller semiconductor quantum dot. High-angle annular dark-field scanning transmission electron microscopy combined with electron energy loss spectroscopy was used to determine the thickness and chemical signature of molecular coating layers, the element atomic ratios, and the exact positions of different elements in single nanoparticles. Moreover, the lipid ratio and lipid phase segregation were also quantified.
Non-Destructive, High-Resolution, Chemically Specific, 3D Nanostructure Characterization using Phase-Sensitive EUV Imaging Reflectometry

Michael Tanksalvala,Christina L. Porter,Yuka Esashi,Bin Wang,Nicholas W. Jenkins,Zhe Zhang,Galen P. Miley,Joshua L. Knobloch,Brendan McBennett,Naoto Horiguchi,Sadegh Yazdi,Jihan Zhou,Matthew N. Jacobs,Charles S. Bevis,Robert M. Karl Jr.,Peter Johnsen,David Ren,Laura Waller,Daniel E. Adams,Seth L. Cousin,Chen-Ting Liao,Jianwei Miao,Michael Gerrity,Henry C. Kapteyn,Margaret M. Murnane

DOI: https://doi.org/10.1126/sciadv.abd9667

2024-03-29

Abstract:Next-generation nano and quantum devices have increasingly complex 3D structure. As the dimensions of these devices shrink to the nanoscale, their performance is often governed by interface quality or precise chemical or dopant composition. Here we present the first phase-sensitive extreme ultraviolet imaging reflectometer. It combines the excellent phase stability of coherent high-harmonic sources, the unique chemical- and phase-sensitivity of extreme ultraviolet reflectometry, and state-of-the-art ptychography imaging algorithms. This tabletop microscope can non-destructively probe surface topography, layer thicknesses, and interface quality, as well as dopant concentrations and profiles. High-fidelity imaging was achieved by implementing variable-angle ptychographic imaging, by using total variation regularization to mitigate noise and artifacts in the reconstructed image, and by using a high-brightness, high-harmonic source with excellent intensity and wavefront stability. We validate our measurements through multiscale, multimodal imaging to show that this technique has unique advantages compared with other techniques based on electron and scanning-probe microscopies.

Optics,Applied Physics,Instrumentation and Detectors
In Situ Electron Microscopy Characterization of Optoelectronic Nanostructures and Nanodevices

M Gao,C Li,W Li,Z Liu,L-M Peng

DOI: https://doi.org/10.1017/s1431927610059842

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

JM Zuo,T Kim,Q Chen,LM Peng,EA Olson

DOI: https://doi.org/10.1017/s1431927608082445

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
High-spatial-resolution composition analysis of micro/nano-structures with a nanoscale compositional variation

Meng Wang,Xiaofeng Wang,Zhican Zhou,Feng Xia,Haoran Zhang,Artem Shelaev,Xinzheng Zhang,Chuanfei Guo,Jingjun Xu,Qian Liu

DOI: https://doi.org/10.1007/s12274-022-4648-0

IF: 9.9

2022-09-19

Nano Research

Abstract:The composition of materials in a micro-/nano-devices plays a key role in determining their mechanical, physical, and chemical properties. Especially, for devices with a compositional change on nanoscale which can often be achieved by point-by-point direct writing technology using a focused ion beam (FIB), electron beam (EB), or laser beam (LB), but so far, nanoscale composition analysis of a large-area micro/nano structures with a variation composition remains a big challenge in cost, simpleness, and flexibility. Here we present a feasible route to realize large-area composition analysis with nanoscale spatial resolution by using Raman spectroscopy. We experimentally verified the capability of this method by analyzing a complex Sn-SnO x system of a microscale grayscale mask with nanoscale spatial resolution of composition. Further analyses using Auger electron spectroscopy, transmission electron microscopy, and atomic force microscopy indicated the effectiveness and practicality of our method. This work opens up a way to analyze the composition of a large-area complex system at a nanoscale spatial resolution, and the method can be extended to many other material systems.

materials science, multidisciplinary,chemistry, physical,physics, applied,nanoscience & nanotechnology
In situ comprehensive characterization of optoelectronic nanomaterials for device purposes.

Chengyao Li,Min Gao,Chen Ding,Xiaoxian Zhang,Lihuan Zhang,Qing Chen,Lian-Mao Peng

DOI: https://doi.org/10.1088/0957-4484/20/17/175703

IF: 3.5

2009-01-01

Nanotechnology

Abstract:We have combined optical fiber probe and nanoprobe techniques in a scanning electron microscope, which enables in situ optical, electrical and structural characterization of optoelectronic nanomaterials and nanodevices. The nanoprobe technique, employing sharp metal tips, is used for in situ nano-manipulation, contact and electrical measurement. The fiber probe, coupled to a spectrometer or a laser and controlled by a nano-manipulator, allows local optical detection or excitation. We show in situ assembly of a light emitter and photodetector based on individual nanostructures, demonstrating the potential application of the above technique in building prototype optoelectronic devices and selecting suitable nanostructures for device purposes. In addition, the angular resolving power of the fiber probe detection is demonstrated to be useful for studying nanoscale waveguides.
Nanospheres Lithography: Recent Advances of Nanospheres Lithography in Organic Electronics (Small 28/2021)

Jie Li,Yongxu Hu,Li Yu,Lin Li,Deyang Ji,Liqiang Li,Wenping Hu,Harald Fuchs

DOI: https://doi.org/10.1002/smll.202170145

IF: 13.3

2021-07-01

Small

Abstract:In article number <a href="https://doi.org/10.1002/smll.202100724">2100724</a>, Deyang Ji, Liqiang Li, Harald Fuchs, and co-workers summarize recent advances of nanospheres lithography in organic electronics, including their applications in versatile organic electronic devices, such as organic field-effect transistors (OFETs), OFET-based sensors, vertical organic light-emitting transistors (VOLETs), organic light emitting diodes (OLEDs), organic photovoltaic devices (OPVs) and some new emerging organic electronic devices. 

materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
Imaging 3D Chemistry at 1 nm Resolution with Fused Multi-Modal Electron Tomography

Jonathan Schwartz,Zichao Wendy Di,Yi Jiang,Jason Manassa,Jacob Pietryga,Yiwen Qian,Min Gee Cho,Jonathan L. Rowell,Huihuo Zheng,Richard D. Robinson,Junsi Gu,Alexey Kirilin,Steve Rozeveld,Peter Ercius,Jeffrey A. Fessler,Ting Xu,Mary Scott,Robert Hovden

DOI: https://doi.org/10.1038/s41467-024-47558-0

2024-06-18

Abstract:Measuring the three-dimensional (3D) distribution of chemistry in nanoscale matter is a longstanding challenge for metrological science. The inelastic scattering events required for 3D chemical imaging are too rare, requiring high beam exposure that destroys the specimen before an experiment completes. Even larger doses are required to achieve high resolution. Thus, chemical mapping in 3D has been unachievable except at lower resolution with the most radiation-hard materials. Here, high-resolution 3D chemical imaging is achieved near or below one nanometer resolution in a Au-Fe$_3$O$_4$ metamaterial, Co$_3$O$_4$ - Mn$_3$O$_4$ core-shell nanocrystals, and ZnS-Cu$_{0.64}$S$_{0.36}$ nanomaterial using fused multi-modal electron tomography. Multi-modal data fusion enables high-resolution chemical tomography often with 99\% less dose by linking information encoded within both elastic (HAADF) and inelastic (EDX / EELS) signals. Now sub-nanometer 3D resolution of chemistry is measurable for a broad class of geometrically and compositionally complex materials.

Computational Physics,Materials Science,Data Analysis, Statistics and Probability
High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

K Dudeck,M Couillard,N Gauquelin,L Gunawan,S Hosseini Vajargah,S Lazar,D Rossouw,Y Shao,G Zhu,G Botton

DOI: https://doi.org/10.1017/s1431927611004843

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Chemically resolved electrical measurements using x-ray photoelectron spectroscopy

Hagai Cohen

DOI: https://doi.org/10.1063/1.1782261

IF: 4

2004-08-16

Applied Physics Letters

Abstract:Noncontact chemically resolved electrical measurements are presented, capable of probing selected regions within fine heterostructures. Using a slightly modified x-ray photoelectron spectrometer, an effective means is demonstrated for measuring I–V curves of molecular layers, free of substrate and contact contributions. The concept is simple and general, revealing unique details on electrical response mechanisms. Realized with commonly available equipment, it should be effective for a broad range of heterostructured systems.

physics, applied
Studying the Electrochemistry of Single Nanoparticles with Surface Plasmon Resonance Microscopy

Tinglian Yuan,Wei Wang

DOI: https://doi.org/10.1016/j.coelec.2017.06.009

IF: 8.5

2017-01-01

Current Opinion in Electrochemistry

Abstract:Surface plasmon resonance microscopy (SPRM) is an emerging label-free optical microscopic imaging technology. It utilizes the planar surface plasmon resonance effect to visualize the optical mass of individual nano-objects. On the basis of appropriate optical-to-electrochemical conversion models, electrochemical current associated with individual nanoparticles can be quantitatively resolved from SPRM images recorded during electrochemical reactions, allowing for cyclic voltammetry and chronoamperometry analysis at single nanoparticle level. More importantly, the spatial resolution of SPRM further enables us to investigate the structure-activity relationship in a bottom-up manner by correlating the structure (from electron microscopes) and the electrochemical activity (from SPRM) of the very same individuals. In this mini-review, we summarize our recent work on using SPRM to study the electrochemical activities of single nanoparticles, and provide our opinions on the challenges and future research directions in this field.
Nanoscale chemical imaging with structured X-ray illumination

Jizhou Li,Si Chen,Daniel Ratner,Thierry Blu,Piero Pianetta,Yijin Liu

DOI: https://doi.org/10.1073/pnas.2314542120

2023-12-05

Abstract:High-resolution imaging with compositional and chemical sensitivity is crucial for a wide range of scientific and engineering disciplines. Although synchrotron X-ray imaging through spectromicroscopy has been tremendously successful and broadly applied, it encounters challenges in achieving enhanced detection sensitivity, satisfactory spatial resolution, and high experimental throughput simultaneously. In this work, based on structured illumination, we develop a single-pixel X-ray imaging approach coupled with a generative image reconstruction model for mapping the compositional heterogeneity with nanoscale resolvability. This method integrates a full-field transmission X-ray microscope with an X-ray fluorescence detector and eliminates the need for nanoscale X-ray focusing and raster scanning. We experimentally demonstrate the effectiveness of our approach by imaging a battery sample composed of mixed cathode materials and successfully retrieving the compositional variations of the imaged cathode particles. Bridging the gap between structural and chemical characterizations using X-rays, this technique opens up vast opportunities in the fields of biology, environmental, and materials science, especially for radiation-sensitive samples.
Nanoelectrochemical Architectures for High-Spatial-resolution Single Cell Analysis

Junyu Zhou,Dechen Jiang,Hong-Yuan Chen

DOI: https://doi.org/10.1007/s11426-017-9109-7

2017-01-01

Science China Chemistry

Abstract:The analysis of single cells instead of cell populations is important for characterizing cellular heterogeneity and elucidating the cellular signalling pathways. Nanoelectrodes have emerged as an increasingly important tool for biomolecule analyses at the single-cell level with high spatial or temporal resolution. Various electrochemical methods, such as amperometry and scanning electrochemical microscopy(SECM), have been applied. Research to date has focused on the development of new nanoelectrochemical architectures, such as arrays, to achieve higher spatial resolution and faster analysis rates for single-cell analysis. In this review, the fabrication of these new nanoelectrochemical architectures and their applications in high spatial resolution single-cell analyses are discussed. The recent progress of Chinese researchers is highlighted.

High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices

Coherent Vibrational Spectroscopy of Electrochemical Interfaces with Plasmonic Nano-gratings.

High-Resolution Transmission Electron Microscopy Imaging Of Carbon Nanostructures

Nanoscale Imaging of Surface Topography and Reactivity with the Scanning Electrochemical Microscope

Advanced Characterization Methods for Electrical and Sensoric Components and Devices at the Micro and Nano Scales

Investigation of Interface Effect of Nanoscale Devices

New Developments in Nanotechnology Research

Electron Microscopy and Diffraction of Crystalline Dendrimers and Macrocycles

Imaging and quantifying the morphology of an organic-inorganic nanoparticle at the sub-nanometre level

Non-Destructive, High-Resolution, Chemically Specific, 3D Nanostructure Characterization using Phase-Sensitive EUV Imaging Reflectometry

In Situ Electron Microscopy Characterization of Optoelectronic Nanostructures and Nanodevices

Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

High-spatial-resolution composition analysis of micro/nano-structures with a nanoscale compositional variation

In situ comprehensive characterization of optoelectronic nanomaterials for device purposes.

Nanospheres Lithography: Recent Advances of Nanospheres Lithography in Organic Electronics (Small 28/2021)

Imaging 3D Chemistry at 1 nm Resolution with Fused Multi-Modal Electron Tomography

High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

Chemically resolved electrical measurements using x-ray photoelectron spectroscopy

Studying the Electrochemistry of Single Nanoparticles with Surface Plasmon Resonance Microscopy

Nanoscale chemical imaging with structured X-ray illumination

Nanoelectrochemical Architectures for High-Spatial-resolution Single Cell Analysis