Determination of Crystal Orientation by Ω-Scan Method in Nickel-Based Single-Crystal Turbine Blades

Kamil Gancarczyk,Robert Albrecht,Hans Berger,Dariusz Szeliga,Andrzej Gradzik,Jan Sieniawski
DOI: https://doi.org/10.1007/s11661-017-4305-5
2017-08-31
Metallurgical and Materials Transactions A
Abstract:The article presents an assessment of the crystal perfection of single-crystal turbine blades based on the crystal orientation and lattice parameter distribution on their surface. Crystal orientation analysis was conducted by the X-ray diffraction method Ω-scan and the X-ray diffractometer provided by the EFG Company. The Ω-scan method was successfully used for evaluation of the crystal orientation and lattice parameters in semiconductors. A description of the Ω-scan method and an example of measurement of crystal orientation compared to the Laue and EBSD methods are presented.
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