Carrier generation-recombination in the space-charge region of an asymmetrical p-n junction

S.C. Choo
DOI: https://doi.org/10.1016/0038-1101(68)90129-9
1968-11-01
Abstract:The theory of generation-recombination in the space-charge region of a symmetrical p-n junction by Sah, Noyce and Shockley is extended to an asymmetrical junction. The role of junction asymmetry in determining the I–V characteristics of the junction is found to be enhanced by the capture asymmetry of donor-like (acceptor-like) recombination centers in an n+-p (p+-n) junction, but diminished in a p+-n (n+-p) junction. Where asymmetry effects are dominant at forward bias, the generation-recombination current is nearly independent of junction voltage, in contrast to the familiar exp(qV2kT) dependence predicted by the theory of Sah et al. Based on the presence of donor-like centers in an n+-p junction, a detailed discussion is given of the effects on the I–V characteristics at small forward bias due to variations in junction asymmetry, the capture asymmetry and energy level of the recombination centers. The theory is applied to InSb diodes, and previous analyses of generation-recombination current data on InSb diodes are examined.
physics, condensed matter, applied,engineering, electrical & electronic
What problem does this paper attempt to address?