Optical Properties of Thickness-Controlled Mos2 Thin Films Studied by Spectroscopic Ellipsometry
Dahai Li,Xiongfei Song,Jiping Xu,Ziyi Wang,Rongjun Zhang,Peng Zhou,Hao Zhang,Renzhong Huang,Songyou Wang,Yuxiang Zheng,David Wei Zhang,Liangyao Chen
DOI: https://doi.org/10.1016/j.apsusc.2016.09.069
IF: 6.7
2017-01-01
Applied Surface Science
Abstract:As a promising candidate for applications in future electronic and optoelectronic devices, MoS2 has been a research focus in recent years. Therefore, investigating its optical properties is of practical significance. Here we synthesized different MoS2 thin films with quantitatively controlled thickness and sizable thickness variation, which is vital to find out the thickness-dependent regularity. Afterwards, several characterization methods, including X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), Raman spectroscopy, photoluminescence (PL), optical absorption spectra, and spectroscopic ellipsometry (SE), were systematically performed to character the optical properties of as-grown samples. Accurate dielectric constants of MoS2 are obtained by fitting SE data using point-by-point method, and precise energies of interband transitions are directly extracted from the Lorentz dispersion model. We assign these energies to different interband electronic transitions between the valence bands and conduction bands in the Brillouin zone. In addition, the intrinsic physical mechanisms existing in observed phenomena are discussed in details. Results derived from this work are reliable and provide a better understanding of MoS2 , which can be expected to help people fully employ its potential for wider applications. (C) 2016 Elsevier B.V. All rights reserved.