Transmission Electron Microscopy Study of the Early-Stage Precipitates in Al-Mg-Si Alloys

H.W. Zandbergen,J.H. Chen,C.D. Marioara,E. Olariu

DOI: https://doi.org/10.1016/b978-008044373-7/50031-0

2003-01-01

Abstract:This chapter reveals that using high-resolution transmission electron microscopy and quantitative electron diffraction, a number of the early-stage precipitates in the Al-Si-Mg based 6xxx alloys, including different GP-zones, the β” phase as well as the so called Q-phase particles is studied. In the structure refinement of the β”, dynamic diffraction was taken into account in full, allowing the accurate elucidation of an unknown structure, in particular by using data sets from various orientations and thicknesses. Since the crystal misorientation is also refined, a mistilt can be used to enhance the resolution in certain directions in diffraction space. The results from the multi-slice least-square (MSLS) refinement are more reliable than those from the through-focus exit-wavefunction reconstruction (TF-EWR), because the diffraction information extends about twice as far. The structure of Mg5Si6 is very likely to be correct, given the low R-values obtained. TF-EWR is a powerful tool for accessing the atomic structural details of nano-scale precipitates, especially those studied here. It can provide a good starting model for a further structural refinement based on micro diffraction data sets taken from the small precipitate crystals.