A Comparison of the Saw Velocity for Thin Film Aluminum Nitride on Silicon by Line Focus Beam Acoustic Microscopy and Direct Transducer Measurements

Fred S. Hickernell
DOI: https://doi.org/10.1007/978-1-4419-8606-1_26
2002-01-01
Abstract:Piezoelectric aluminum nitride (A1N) films have been deposited as transducers for the development of bulk acoustic wave (BAW) and surface acoustic waves (SAW) components for electronic device applications over the past 30 years. These acoustic wave devices, such as filters, resonators, and delay lines in the 100 MHz to 10 GHz region, occupy dimensions that are orders of magnitude smaller than their electronic counterparts. In evaluating the properties of thin film AIN, it has been particularly helpful to look at the SAW velocity characteristics and to compare them to the velocity characteristics of the bulk single crystal material. If the SAW velocity characteristics of the film compare favorably with the single crystal, it normally follows that the elastic, piezoelectric, dielectric, and loss constants of the film closely match the bulk properties. In this investigation a comparison is made between SAW velocities of sputtered thin-film AIN on four silicon wafers with buffer layers measured by line-focus-beam scanning acoustic microscopy (LFBSAM) and interdigital transducer (IDT) aluminum metal electrode patterns photolithographically replicated directly on the surface of the AIN film.
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