Transparent multi-level-cell nonvolatile memory with dual-gate amorphous indium-gallium-zinc oxide thin-film transistors

Min-Ju Ahn,Won-Ju Cho
DOI: https://doi.org/10.1063/1.4972961
IF: 4
2016-12-19
Applied Physics Letters
Abstract:A fully transparent, nonvolatile charge-trap-flash memory that is based on amorphous indium-gallium-zinc-oxide thin film transistors was fabricated with a dual gate (DG) structure for a multi-level-cell (MLC) application. A large memory window was obtained at a low program voltage in the DG read-operation mode owing to the capacitive-coupling effect between the front gate and the back gate. The MLC was implemented by using the DG read-operation mode with four highly stable levels, as follows: A large threshold-voltage difference >3.5 V per level was obtained under a low program voltage <14 V with a fast program speed of 1 ms. In contrast, the conventional single gate operation mode was incompatible with the MLC application.
physics, applied
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