Deposition of Ga2O3 thin films by liquid metal target sputtering

Martins Zubkins,Viktors Vibornijs,Edvards Strods,Edgars Butanovs,Liga Bikse,Mikael Ottosson,Anders Hallén,Jevgenijs Gabrusenoks,Juris Purans,Andris Azens
DOI: https://doi.org/10.1016/j.vacuum.2022.111789
IF: 4
2023-03-01
Vacuum
Abstract:This paper reports on the deposition of amorphous and crystalline thin films of Ga2O3 by reactive pulsed direct current magnetron sputtering from a liquid gallium target onto fused (f-) quartz and c plane (c-) sapphire substrates, where the temperature of the substrate is varied from room temperature (RT) to 800 °C. The deposition rate (up to 37 nm/min at RT on f-quartz and 5 nm/min at 800 °C on c-sapphire) is two to five times higher than the data given in the literature for radio frequency sputtering. Deposited onto unheated substrates, the films are X-ray amorphous. Well-defined X-ray diffraction peaks of β-Ga2O3 start to appear at a substrate temperature of 500 °C. Films grown on c-sapphire at temperatures above 600 °C are epitaxial. However, the high rocking curve full width at half maximum values of ≈2.4–2.5° are indicative of the presence of defects. A dense and void-free microstructure is observed in electron microscopy images. Composition analysis show stoichiometry close to Ga2O3 and no traces of impurities. The optical properties of low absorptance (<1%) in the visible range and an optical band gap of approximately 5 eV are consistent with the data in the literature for Ga2O3 films produced by other deposition methods.
materials science, multidisciplinary,physics, applied
What problem does this paper attempt to address?