Dielectric spectroscopy of Ge<inf>2</inf>Sb<inf>2</inf>Te<inf>5</inf> and VO<inf>2</inf> upon temperature-induced phase transitions

A. A. Bogutskii,A. A. Gavdush,G. A. Komandin,D. S. Ponomarev,Qiwu Shi,K. I. Zaytsev
DOI: https://doi.org/10.1109/ICLO59702.2024.10624337
2024-01-01
Abstract:Phase change materials (PCM) forms a platform for multiple applications in modern optics, photonics, microelectronics. In this work, we performed broadband dielectric spectroscopy of Ge <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> Sb <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> Te <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">5</inf> (GST) and VO <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> phase change materials in a form of thin films on a sapphire substrate. Broadband dielectric response of three different GST phases was retrieved and thoroughly analyzed. Reversible metal-insulator transition (MIT) of VO <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> film was studied over the broad range of temperatures covering typical hysteresis loop of the material. The factor of residual pressure in the sample chamber was considered. Spectroscopy results were supplemented with the electrical conductivity measurements. Reconstructed THz-IR response was analyzed using classical models of complex dielectric permittivity for all the studied phases of PCMs.
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