Unveiling High Resistivity Mechanism in (0.8-X)batio3-0.2bisco3-x(bi0.5li0.5)tio3 Ceramics with Good Dielectric Temperature-Stability

Zhihong Luo,Jin Kong,Xue Chen,Liaoting Pan,Xuezhong Huang,Dawei Wang,Qingfeng Zhu,Weiping Gong,Laijun Liu
DOI: https://doi.org/10.1016/j.ceramint.2024.06.379
IF: 5.532
2024-01-01
Ceramics International
Abstract:Focusing on the high resistivity together with low intrinsic conduction in BaTiO3-BiMeO3 materials, it can contribute to the development of reliable high-temperature capacitor materials. In this work, x(Bi0 & sdot;5Li0.5)TiO3(0.8-x)BaTiO3-0.2BiScO3 (where x ranges from 0 to 0.2) ceramics were fabricated by a solid reaction method. The temperature stability of dielectric permittivity and resistance are improved significantly by the introduce of (Bi0 & sdot;5Li0.5)TiO3 (referred to as BL) compared to BaTiO3-BiMeO3. The composition discrepancy due to chemical inhomogeneity can be determined by SEM and EDS mapping although XRD exhibit a single perovskite phase. The characteristics of distinct conductivity behaviors in micro-regions was measured by kelvin probe force microscopy (KPFM). The non-stoichiometry gives rise to two kinds of defects for charge compensation: an ionic compensation and oxygen-vacancy compensation in different grains. The increase of the hopping activation energy of charged carries enhances the high-temperature resistance of the system. The sample of x = 0.15 shows very good temperature stability of dielectric permittivity in the temperature range from 200 degrees C to 400 degrees C, and that of x = 0.1 exhibits the highest resistivity of 3.6 M Omega cm at 570 degrees C. The proposed method gives an efficient strategy for improving the dielectric temperature stability and insulation by the special defect compensation in the perovskite oxides.
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