In-depth Understanding of the Band Alignment and Interface States Scenario in Bi_2O_2Se/SrTiO_3 Ultrathin Heterojunction

Ke Zhang,Yusen Feng,Lei Hao,Jing Mi,Miao Du,Minghui Xu,Yan Zhao,Jianping Meng,Liang Qiao
2024-01-01
Abstract:Bismuth oxyselenide (Bi_2O_2Se), a novel quasi-2D charge-carrying semiconductor, is hailed as one of the best emerging platforms for the next generation semiconductor devices. Recent efforts on developing diverse Bi_2O_2Se heterojunctions have produced extensive potential applications in electronics and optoelectronics. In-depth understanding of the band alignment and especially interface dynamics is, however, still challenging. In this work, a comprehensive experimental investigation on the band alignment is performed by a high-resolution X-ray photoelectron spectrometer (HRXPS), and the properties of interface states are also fully discussed. The results show that the ultrathin film Bi_2O_2Se grown on SrTiO_3 (TiO_2 (001) termination) exhibits Type-I (straddling gap) band alignment with a valence band offset (VBO) of about 1.77±0.04 eV and conduction band offset (CBO) of about 0.68±0.04 eV. However, further considering the contribution of the interface states, the bands on the interface present a herringbone configuration due to sizable build-in electric fields, which is significantly different from the conventional band alignment. In this sense, our results provide an insightful guidance to the development of high-efficiency electronic and optoelectronic devices, specifically of the devices where the charge transfer is highly sensitive to interface states.
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