A Semi-Physical Model of SiC MOSFETs for Improved Static Characteristic

Qingsong Liu,Pengju Sun,Guoxiu Peng,Xing Ma
DOI: https://doi.org/10.1109/cieec60922.2024.10583229
2024-01-01
Abstract:Silicon Carbide (SiC) MOSFETs have been widely applied in power converters due to its superior properties. Accurate simulation of SiC MOSFET is essential to its application. This paper presents a semi-physical model of SiC MOSFET, which has an excellent performance at static characteristic. The proposed model is based on the description of physical phenomena include the influence of SiC/SiO2 traps and the saturate process of channel voltage. The model is validated on a 1.2kV-19A SiC MOSFET, and application of the model at different temperature is discussed.
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