Ultrathin Resist Films Patterning Using a Synchrotron Radiation Lithography System

Wu Lu,Ning Gu,Wei Yu,Yangchao Tian
DOI: https://doi.org/10.1016/s0042-207x(96)00239-4
IF: 4
1997-01-01
Vacuum
Abstract:Ultrathin polymethylmethacrylate (PMMA) films with a width of 17–59.5 nm have been prepared for X-ray resist by Langmuir-Blodgett (LB) technique on a trough using a steady laminar flowing subphase for monolayer compression. Using a synchrotron radiation (SR) lithography system as an exposure tool, patterns with 0.2 μm critical dimensions have been obtained, limited to the mask used.
What problem does this paper attempt to address?