Abstract:A considerable amount of information can be gained from combined collection of both digital image correlation (DIC) measurements, and of electron backscattered diffraction (EBSD) data from the same area during in-situ deformation experiments. Such data collection remains a challenge, however, due the influence of the surface markers required for DIC on the EBSD data quality. In this work we demonstrate that by careful control of the sample preparation process, a two-step electropolishing method can be used to generate excellent surface markers for DIC where the markers are integral features on the surface. The method does not require any special equipment and can be used to collect high quality EBSD data and DIC data with sub-micron resolution on the same area during repeated loading as part of in-situ deformation experiments. Combined EBSD and DIC measurements are illustrated in this work for samples of Al deformed in tension to a strain of 10%. Due to the integral nature of the surface markers we demonstrate also that it is possible to perform DIC measurements up to large plastic strains, including the necked region within a tensile sample. A comparison of EBSD and DIC data collected from the same area of a tensile-deformed sample shows that although the EBSD data provide excellent information on the lattice rotations developed during deformation, these data cannot be directly used as a measure of local plastic strain on the scale of the deformation microstructure. The ability to collect both EBSD and DIC data during an in-situ experiment provides, therefore, an opportunity to explore further the complex relationship between local plastic strain heterogeneity and EBSD-based measures of crystal lattice rotation.

I-DIC EBSD Indexation Results

High-definition Electron Diffraction Patterns and Their Indexation Results of a Single Crystal Si Wafer

Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation

Surface Patterning for Combined Digital Image Correlation and Electron Backscatter Diffraction In-Situ Deformation Experiments

Improved EBSD indexation accuracy by considering energy distribution of diffraction patterns

Indexation of electron diffraction patterns at grain boundaries

High Strain Gradient Plasticity Associated with Wedge Indentation into Face-Centered Cubic Single Crystals: Geometrically Necessary Dislocation Densities

Analysis of Stress and Deformation States in Wedge Indented Face-Centered Cubic Single Crystals

In-situ Study of Microstructural Evolution and Local Strain Distribution During Tensile Loading of Near-Micrometre Grain Size Aluminium

Resolving localized geometrically necessary dislocation densities in Al-Mg polycrystal via in situ EBSD

In Situ Characterization of Deformation Twinning in Magnesium During Cyclic Loading Via Electron Backscatter Diffraction

Surface Patterning Allowing Combined EBSD and DIC Investigations During In-Situ Deformation Experiments

Investigation of Medium to High Strain Deformation Microstructures Using an Automated Electron Backscattering Pattern (EBSP) System

Investigation of Grain Subdivision at Very Low Plastic Strains in A Magnesium Alloy

Compressive Electron Backscatter Diffraction Imaging

Estimation of Elastic Strain by Integrated Image Correlation on Electron Diffraction Patterns.

Accuracy assessment of crystal orientation indexations by EBSD

Residual-based pattern center calibration in high-resolution electron backscatter diffraction

Tensile Test Coupled with an EBSD Study of a GH4169 Ring Rolled Product

Refinements for Bragg coherent X-ray diffraction imaging: Electron backscatter diffraction alignment and strain field computation

A new method for locating Kikuchi bands in electron backscatter diffraction patterns