Surface Defect Detection of GIS Aramid Insulation Pull Rod Via Photon Counting

Hanhua Luo,Xianhao Fan,Fangwei Liang,Jun Hu,Bingyue Yan,Tengfei Li,Jinliang He,Chuanyang Li
DOI: https://doi.org/10.1109/tdei.2024.3370130
IF: 2.509
2024-01-01
IEEE Transactions on Dielectrics and Electrical Insulation
Abstract:The flashover and breakdown faults induced by surface defects of aramid insulation pull rods (AIPRs) seriously threaten the safe operation of high-voltage gas-insulated switchgear (GIS). To accurately detect the surface defects of AIPRs, this article proposes a high-sensitivity detection method based on the photon counting (PC) technique. The PC characteristics of AIPR samples under different voltages and defect sizes of grounding burrs are investigated, and the influence of defects is also explained by simulation analysis. Results reveal that the defects make the photon number increase sharply, and the increased amplitude is positively correlated with the defect size. The investigation of the feature of photons indicates that it is possible to determine the quantitative relationship between PC results and defect size. In this regard, the PC method provides a new approach for the offline detection of surface defects of GIS AIPRs.
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