Research progress in high-performance power device pack-aging and power cycle reliability

GUAN Ruofei,JIA Qi-ang,ZHAO Jin,ZHANG Hongqiang,WANG Yishu,ZOU Guisheng,GUO Fu
DOI: https://doi.org/10.12073/j.hjxb.20230613015
2023-01-01
Abstract:The progress of semiconductor technology has made power devices face higher voltage,power density and junction temperature,which puts forward higher requirements for the reliability of power device packaging.How to improve and detect the reliability of power devices has become an im-portant task in the development of power devices.Improving packaging reliability mainly focuses on optimizing packaging structure,improving die attach technology and wire bonding technology.Power cycling,as a reliability testing method closest to the actual operating conditions of power devices,has been widely studied in terms of testing techniques,monitoring methods,and failure mechanisms.This paper provides a re-view of research on the packaging structure,packaging techno-logy,power cycling mechanism of power devices and attempts to summarize the methods for improving packaging reliability at home and abroad in recent years.This review also discusses the principles of power cycling test and the failure mechanisms of solder layers and bonding wires.Finally,the future devel-opment trend of power device packaging was prospected.
What problem does this paper attempt to address?