Solder Joint in Electronic Packages and Its Reliability

WANG Qian,Shi-Wei Ricky LEE,WANG Gang-qiang,GENG Zhi-ting,HUANG Le,TANG Xiang-yun,Ma Ju-sheng
DOI: https://doi.org/10.3969/j.issn.1001-2028.2000.02.012
2000-01-01
Abstract:ELECTRONIC COMPONENTS MATERIALS (China), Vol 19, No 2, P 24 26 (Apr 2000) In Chinese Failure of a single solder joint in an electronic package may cause the overall failure of the device, even the whole system Failures of solder joints usually result from the growth of creep/fatigue crack under thermal cycling The research of solder joints and its reliability is introduced, with respects of solder joint microstructure, failure analysis, reliability forecast, etc (12 refs )
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