Abstract:Our present work is devoted to analyzing the influence of Ni on the optical properties of ZnO thin films deposited on glass and Si (100) substrates, with the use of ALD for ZnO deposition and DC magnetron sputtering for Ni interlayer deposition. The compositions as well as the crystalline structure of various multilayer thicknesses of Ni (10, 30, 50, and 70 nm), that sandwiched between ZnO Films (70 nm), before being optically characterized, were carried out by the X-ray diffraction (XRD) Based on the XRD results, the crystallite size was increased with the increase of the Ni interlayer concentration. Additionally, the material densities for both ZnO and Ni show the expected close-to-bulk values in all formations, where the large cavities between atoms, on the films make the dislocation density become smaller and the surface roughness values decrease as well, with the increase of Ni interlayer concentration. Different optical properties were observed for different Ni content. The optical absorption coefficient (α), refractive index ( n ), and extinction coefficient ( k ) have been deduced from the transmission T(λ) and absorption measurements A(λ). The optical energy gap Egopt are estimated from Tauc ́s extrapolation procedure and the Kubelka-Munk approach. The static refractive index ( n o ), the oscillator energy ( E o ), and the dispersion energy ( E d ) are calculated using the Wemple-DiDomenico (WDD) theoretical model. Analysis of third-order nonlinear optical properties in crystalline ZnO/Ni/ZnO are being detailed. These promising results imply that the high-quality films produced by ALD, show how the insertion of Ni could enhance the quality of the optical properties of ZnO films.

An Analysis of the X-Ray Linear Dichroism Spectrum for NiO Thin Films Grown on Vicinal Ag(001)

Experimental Study Of The X-Ray Linear Dichroism Of Nio Films Grown On Fe(001)

Tailoring the Spin Direction of Antiferromagnetic Nio Thin Films Grown on Vicinal Ag(001)

In-plane Spin Reorientation Transition in Fe/NiO Bilayers on Ag(1,1,10)

Electron Quantum Interference in Epitaxial Antiferromagnetic NiO Thin Films

Electronic states and structural characterization in single-crystal Fe–Ni–O alloy thin films grown by molecular beam epitaxy

Near-surface electronic structure in strained Ni-ferrite films: An x-ray absorption spectroscopy study

Antiferromagnetic Spin Reorientation Transition in Epitaxial Nio/Coo/Mgo(001) Systems

Perpendicular and in-plane hole asymmetry in a strained NiFe2O4film

In Situ Reflection High-Energy Electron Diffraction Observation of Epitaxial LaNiO3 Thin Films

NiO-thickness dependent magnetic anisotropies in Fe/NiO/Au(001) and Fe/NiO/MgO(001) systems

Analysis of Local Structures Around Ni Atoms Doped in Zno-Based Diluted Magnetic Semiconductors by Fluorescence Exafs

Perpendicular magnetic anisotropy of an ultrathin Fe layer grown on NiO(001)

Anisotropic Ferromagnetic Behaviors in Highly Orientated Epitaxial NiO-based Thin Films

Linearization and characterization of the Wemple – DiDomenico model of ZnO/Ni/ZnO tri-layer thin films prepared by ALD and DC magnetron sputtering

Element-Specific Study Of The Anomalous Magnetic Interlayer Coupling Across Nio Spacer Layer In Co/Nio/Fe/Ag(001) Using Xmcd And Xmld

Bulk-like structural, magnetic and optical properties of (111)- and (001)-NiO thin films

Spectroscopic Ellipsometry Study of Thin NiO Films Grown on Si (100) by Atomic Layer Deposition

Investigation of Dispersion of Nickel Oxide Onto the Surface of Gamma-Alumina by Exafs

Interfacial Orbital Preferential Occupation Induced Controllable Uniaxial Magnetic Anisotropy Observed in Ni/NiO(110) Heterostructures

Investigating the physicochemical characteristics of monovalent metal-doped nickel oxide thin films