Electron Quantum Interference in Epitaxial Antiferromagnetic NiO Thin Films

Jia Xu,Feng Lou,Mengwen Jia,Gong Chen,Chao Zhou,Qian Li,Kai Liu,Andreas K. Schmid,Hongjun Xiang,Yizheng Wu
DOI: https://doi.org/10.1063/1.5129772
IF: 1.697
2020-01-01
AIP Advances
Abstract:The electron reflectivity from NiO thin films grown on Ag(001) has been systematically studied as a function of film thickness and electron energy. A strong electron quantum interference effect was observed from the NiO film, which is used to derive the unoccupied band dispersion above the Fermi surface along the Γ−X direction using the phase accumulation model. The experimental bands agree well with first-principles calculations. A weaker electron quantum interference effect was also observed from the CoO film.
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