Experimental Study Of The X-Ray Linear Dichroism Of Nio Films Grown On Fe(001)

Yizheng Wu,Boris Sinković,Changyeon Won,Jingtao Zhu,Y. Zhao,Ziqiang Qiu
DOI: https://doi.org/10.1103/PhysRevB.85.134436
IF: 3.7
2012-01-01
Physical Review B
Abstract:X-ray linear dichroism (XLD) effects at the Ni L-2 edge of NiO films grown on Fe(001) were studied systematically as a function of NiO thickness (d(NiO)), temperature, interfacial modulation, and Fe magnetization directions. We found that the Ni XLD signal exhibited an unusual dependence on d(NiO). The XLD effect persists above the Neel temperature and exhibits a similar d(NiO)-dependence as the behavior at room temperature. On the other hand the Ni XLD signal reverses its sign as the Fe magnetization is switched by 90 degrees. We propose a possible mechanism such that the Fe magnetostriction induces the NiO uniaxial crystal field to dominate the XLD magnitude in the NiO/Fe(001) system.
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