Effect Ofnonuniformities Ofmicrostructure Andelectrical Property Ofgrainboundary to Theglobal Electrical Characteristics

Youping Tu,Lijian Ding,Jinliang He
2006-01-01
Abstract:Theinfluence ofthegeometry andtopology ofthegranular microstructure, aswellastheproperties andthedistribution of thedifferent typesof microjunctions onthefeatures ofbulkvaristor devices isanimportant andinteresting problem. Simulating analysis ontheactual microstructure andelectrical characteristics ofZnOvaristors isusedto effectively analyze theinfluences ofdifferent factors, suchasgrain size, barrier voltage andnonlinearity coefficient of single grainboundary, on theglobal electrical characteristics, andtheeffect oftheir distribution related tothenonuniformities ofZnO varistors was considered. Thecurrent concentration anddumbgrains lead tothenonuniform ofcurrent distribution, andthe energy handling capability ofZnOvaristor isreduced.
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