Effect of SiO_2 Doping Content on Varistor Properties of ZnO

DUAN Lei,XU Gao-jie,WANG Yong-ye,WANG Qin,LI Zhi-xiang,CUI Ping
2009-01-01
Abstract:ZnO varistors were prepared by solid state reaction method and their microstructure and electrical properties were investigated by X-ray diffraction(XRD),scanning electron microscopy(SEM) and I-V curves.The results indicated that appropriate SiO2-doped can improve the uniformity of grains and the microstructure,increase the non-linearity coefficient α which is helpful to the glass transition of grain boundary,but also can enhance the stability and decrease the leakage current(IL).Superfluous SiO2 doping will restrain the growth of grains and improve the breakdown voltage of varistor,but the variety of intergranular phase will result in the increase of leakage current(IL).The sample with a maximum density was reached at SiO2 content of 0.7 wt%.A few SiO2 doping can increase the non-linearity coefficient(α) and decrease the leakage current(IL).
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