Ultracompact Polarization-Insensitive Waveguide Crossing Based on Dielectric Metasurface

Boai Liu,Yu Wan,Yingjie Liu
DOI: https://doi.org/10.1109/lpt.2023.3337360
IF: 2.6
2024-01-01
IEEE Photonics Technology Letters
Abstract:A compact polarization-insensitive silicon waveg-uide crossing is proposed and experimentally demonstrated. Thedielectric metasurface can extremely manipulate the effectiverefractive profile to keep high transmittance in the propagationdirection and shrink the device footprint. Our designed crossinghas an ultra-wideband operating bandwidth covering 1200 nmto 1700 nm for dual-polarization (insertion loss<0.4 dB) andan ultra-compact footprint of only 4.8x4.8 mu m(2). The simulated results indicate the device has a good fabrication tolerance. Subsequently, an ultra-densely (30x30 mu m2)polarization-multiplexed integrated circuit consisting of a crossing and fourpolarization splitter-rotators is designed and fabricated. Themeasured circuit is characterized with low insertion loss and low crosstalk over 100 nm bandwidth. These compact components and circuits pave an alternative way for large-scale high-capacityoptical communication system
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