Abstract:In nanometer complementary metal-oxide-semiconductor technologies, worst-case design methods and response-surface-based yield optimization methods face challenges in accuracy. Monte-Carlo (MC) simulation is general and accurate for yield estimation, but its efficiency is not high enough to make MC-based analog yield optimization, which requires many yield estimations, practical. In this paper, techniques inspired by computational intelligence are used to speed up yield optimization without sacrificing accuracy. A new sampling-based yield optimization approach, which determines the device sizes to optimize yield, is presented, called the ordinal optimization (OO)-based random-scale differential evolution (ORDE) algorithm. By proposing a two-stage estimation flow and introducing the OO technique in the first stage, sufficient samples are allocated to promising solutions, and repeated MC simulations of non-critical solutions are avoided. By the proposed evolutionary algorithm that uses differential evolution for global search and a random-scale mutation operator for fine tunings, the convergence speed of the yield optimization can be enhanced significantly. With the same accuracy, the resulting ORDE algorithm can achieve approximately a tenfold improvement in computational effort compared to an improved MC-based yield optimization algorithm integrating the infeasible sampling and Latin-hypercube sampling techniques. Furthermore, ORDE is extended from plain yield optimization to process-variation-aware single-objective circuit sizing.

OPT: Optimal Proposal Transfer for Efficient Yield Optimization for Analog and SRAM Circuits

Efficient Bayesian Yield Optimization Approach for Analog and SRAM Circuits

Efficient Yield Optimization for Analog and SRAM Circuits Via Gaussian Process Regression and Adaptive Yield Estimation

Design Time Body Bias Selection for Parametric Yield Improvement.

An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits.

Bayesian Methods for the Yield Optimization of Analog and SRAM Circuits

Seeking the Yield Barrier: High-Dimensional SRAM Evaluation Through Optimal Manifold

Efficient and Accurate Statistical Analog Yield Optimization and Variation-Aware Circuit Sizing Based on Computational Intelligence Techniques

Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation.

Efficient Bayesian Yield Analysis and Optimization with Active Learning

An Efficient Yield Optimization Method for Analog Circuits Via Gaussian Process Classification and Varying-Sigma Sampling

A New Yield Optimization Algorithm and Its Applications

A Fast Method for Extracting and Optimizing Critical Area to Improve Yield

An Efficient SRAM Yield Analysis and Optimization Method with Adaptive Online Surrogate Modeling

An Efficient Bi-Objective Optimization Framework for Statistical Chip-Level Yield Analysis under Parameter Variations.

Analog Circuit Yield Optimization Via Freeze–Thaw Bayesian Optimization Technique

Yield Optimization for Analog Circuits over Multiple Corners Via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation

An Efficient Bayesian Yield Estimation Method for High Dimensional and High Sigma SRAM Circuits.

A Fast Non-Monte-Carlo Yield Analysis and Optimization by Stochastic Orthogonal Polynomials

A Yield-Enhanced Global Optimization Methodology for Analog Circuit Based on Extreme Value Theory

An Efficient SRAM Yield Analysis Method using Multi -Fidelity Neural Network