Studies on the surface treatment of InAs/GaSb type-II super-lattice long-wave infrared detectors

Cui Yu-Rong,Zhou Yi,Huang Min,Wang Fang-Fang,Xu Zhi-Cheng,Xu Jia-Jia,Chen Jian-Xin,He Li
DOI: https://doi.org/10.11972/j.issn.1001-9014.2023.01.002
2023-01-01
JOURNAL OF INFRARED AND MILLIMETER WAVES
Abstract:In this work,the surface treatment of InAs/GaSb type-II super-lattice long-wavelength infrared detectors is studied. An optimizing process of N2O plasma treatment and rapid thermal annealing was developed,which can improve the performance of long-wavelength detector with (lambda 50% cut-off)=12. 3 mu m from 5.88x10(-1)A/cm(2) to 4. 09x10(-2)A/cm(2) at liquid nitrogen temperature,-0. 05V bias. Through variable area device array characterization,the sidewall leakage current was extracted. Under zero bias,the surface resistivity improved from 17. 9 Omega cm to 297. 6 Omega cm. However,the sidewall leakage couldn't be ignored under large inverse bias after optimizing process,where surface charge might induce the surface tunneling current. It is verified by gate-control structure that there are two main leakage mechanisms in longwave device:pure sidewall parallel resistance and surface tunneling. At last,the surface charge was calculated to be 3.72x10(11)cm(-2) by IV curve fitting after optimizing process.
What problem does this paper attempt to address?