ICP Etching for InAs-based InAs/GaAsSb Superlattice Long Wavelength Infrared Detectors

Wu Jia,Xu Zhi-Cheng,Chen Jian-Xin,He Li
DOI: https://doi.org/10.1016/j.infrared.2018.03.003
IF: 2.997
2018-01-01
Infrared Physics & Technology
Abstract:Wet chemical etching of InAs-based InAs/Ga(As)Sb superlattice long wavelength infrared photodiodes was studied in this paper. The etching experiments using citric acid, orthophosphoric acid and hydrogen peroxide were carried out on InAs, GaSb bulk materials and InAs/Ga(As)Sb superlattices with different solution ratios. An optimized etching solution for the InAs-based superlattices has been obtained. The etched surface roughness is only 1 nm. InAs-based superlattice LWIR detectors with 50 % cut-off wavelength of 12 mu m were fabricated. The photodetectors etched with optimized solution ratio show low surface leakage characteristic. At 81 K temperature, the surface resistivity rho(Surface) of the detector is 4.4 x 10(3) Omega cm.
What problem does this paper attempt to address?