Hysteresis-Free Contact Doping for High-Performance Two-Dimensional Electronics

Jun-Ru Chang,Po-Hsun Ho,Chun-Hsiang Chen,Chun-Hao Chiang,Cheng-Hung Hou,Min-Chuan Shih,Hung-Chang Hsu,Wen-Hao Chang,Jing-Jong Shyue,Ya-Ping Chiu,Chun-Wei Chen
DOI: https://doi.org/10.1021/acsnano.2c10631
IF: 17.1
2023-01-01
ACS Nano
Abstract:Contact doping is considered crucial for reducing the contact resistance of two-dimensional (2D) transistors. However, a process for achieving robust contact doping for 2D electronics is lacking. Here, we developed a two-step doping method for effectively doping 2D materials through a defect-repairing process. The method achieves strong and hysteresis-free doping and is suitable for use with the most widely used transition-metal dichalcogenides. Through our method, we achieved a record-high sheet conductance (0.16 mS·sq-1 without gating) of monolayer MoS2 and a high mobility and carrier concentration (4.1 × 1013 cm-2). We employed our robust method for the successful contact doping of a monolayer MoS2 Au-contact device, obtaining a contact resistance as low as 1.2 kΩ·μm. Our method represents an effective means of fabricating high-performance 2D transistors.
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