Characterization of Single Crystal Diamond Damaged Layer Induced by Ion Implantation and Restored by Varying Annealing Conditions

Jiao Fu,Qin Lu,Guo Li,Fengnan Li,Fei Wang,Ruo-Zheng Wang,Tian-Fei Zhu,Zongchen Liu,Daming Chen,Garuma Abdisa,Hong-Xing Wang
DOI: https://doi.org/10.1016/j.micrna.2022.207442
2022-01-01
Micro and Nanostructures
Abstract:Fabrication of single crystal diamond (SCD) micro-structure remains a challenge due to its unique chemical and mechanical stability. Fortunately, the stable diamond sp3 bonds can be changed by using ion implantation technology. Ion implantation induced defects present a gaussian-like distribution in the vertical area. The high-damaged area can be etched by chemical treatments, while the low-damaged area which is usually difficult to eliminate could degrade the performance of diamond devices. In this study, fabrication of SCD three-dimensional micro-structure on HPHT diamond substrate by using ion implantation and lift-off techniques has been carried out. A thermal annealing step is employed to remove residual damage induced by ion implantation process. Raman and photoluminescence spectroscopies are used to characterize the top side and back side of low-damaged layer induced by ion implantation and restored by varying thermal annealing conditions.
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