Improve the On-Resistance for 80V NLDMOS with STI Technology in 0.18 UM BCD Process

Xiaoming Zhang,Donghua Liu,Haiyang Ling,Wensheng Qian
DOI: https://doi.org/10.1109/cstic55103.2022.9856810
2022-01-01
Abstract:In recent years, devices used in power application are required to operate at high voltage, high frequency conditions and at low current to save energy. As a result, it is important to improve the specific on-resistance (RON) for switch LDMOS. In this paper, we will aim at 80VnLDMOS in 0.18um BCD process to discuss the composition of on-resistance and analysis the dominated part of RON. This paper also proposes a simple method to improve the RON. Based on no additional masks and complex process flows, the combination of adjusting ratio of field plate and multiple ion implantation in drift region can improve BV and reduce Ron. The method can improve the on-resistance, which are proved by TCAD simulation results.
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