Enhanced Resistive Switching Characteristics of FeMnO3 Resistive Random Access Memory Devices with Embedding Au Nanoparticles

Yu Zhang,Jiacheng Li,Xinman Chen,Shuxiang Wu,Ni Qin,Dinghua Bao
DOI: https://doi.org/10.1016/j.tsf.2022.139320
IF: 2.1
2022-01-01
Thin Solid Films
Abstract:Au nanoparticles (Au NPs) embedded FMO (Au-FMO) thin films were fabricated on Pt/Ti/SiO2/Si substrates by using a chemical solution deposition method. The sandwich structured Pt/Au-FMO/Pt devices exhibit bipolar resistive switching behavior with uniform Set/Reset voltage distribution, stable high and low resistance values, and excellent retention characteristics. The introduction of Au NPs can enhance the local electric field, which greatly reduces the randomness of the generation and fracture of oxygen vacancy conductive filaments. The conduction mechanisms of Pt/Au-FMO/Pt devices in low resistance state and high resistance state can be described by Ohmic conduction and space charge limited current model, respectively. The results show that the Au-FMO films have great potential in the field of resistive random access memory devices.
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