Atomic Threshold-Switching Enabled MoS2 Transistors Towards Ultralow-Power Electronics
Qilin Hua,Guoyun Gao,Chunsheng Jiang,Jinran Yu,Junlu Sun,Taiping Zhang,Bin Gao,Weijun Cheng,Renrong Liang,He Qian,Weiguo Hu,Qijun Sun,Zhong Lin Wang,Huaqiang Wu
DOI: https://doi.org/10.1038/s41467-020-20051-0
IF: 16.6
2020-01-01
Nature Communications
Abstract:Power dissipation is a fundamental issue for future chip-based electronics. As promising channel materials, two-dimensional semiconductors show excellent capabilities of scaling dimensions and reducing off-state currents. However, field-effect transistors based on two-dimensional materials are still confronted with the fundamental thermionic limitation of the subthreshold swing of 60 mV decade −1 at room temperature. Here, we present an atomic threshold-switching field-effect transistor constructed by integrating a metal filamentary threshold switch with a two-dimensional MoS 2 channel, and obtain abrupt steepness in the turn-on characteristics and 4.5 mV decade −1 subthreshold swing (over five decades). This is achieved by using the negative differential resistance effect from the threshold switch to induce an internal voltage amplification across the MoS 2 channel. Notably, in such devices, the simultaneous achievement of efficient electrostatics, very small sub-thermionic subthreshold swings, and ultralow leakage currents, would be highly desirable for next-generation energy-efficient integrated circuits and ultralow-power applications.