Abstract:Birefringence measurements, using a scanning infrared polariscope (SIRP) with high sensitivity, have been carried out in as-grown dislocation-free silicon single crystal ingots. A small amount of birefringence due to 〈110〉 optical anisotropy, which is predicted not by the classical optics theory but by the Lorentz's spatial dispersion theory, is observed in the θ–Z optical configuration, for which a probing polarized light is introduced from the as-grown cylindrical ingot surface and then the polarization of the light transmitted through the opposite surface is analyzed. On the other hand, in the R–θ optical configuration, for which the probing polarized light is introduced along the 〈001〉 crystal growth direction from the (001) sliced and polished surface and then the polarization of the light transmitted through the opposite (001) surface is analyzed, the birefringence is still observed although it is extremely small. It is found that this 〈001〉 optical anisotropy is not constant over the (001) cross-section of the ingot but consists of two different components, i.e. a symmetric component distributed over the whole sample, probably caused by point defects, and an asymmetric component distributed randomly near the peripheral region, related to dents and chips on the as-grown cylindrical surface.

OBSERVATION OF DISLOCATIONS AND SUBBOUNDARIES IN OPTICALLY ACTIVE CRYSTAL Bi<sub>12</sub>GeO<sub>20</sub> BY MEANS OF REFLECTION BIREFRINGENCE TOPOGRAPHY

Observation of dislocations and subboundaries in the optically active crystal Bi 12 GeO 20 with reflection birefringence topography

THE OPTICAL CONTRAST OF DISLOCATION IN SYNTHETIC QUARTZ WITH BIREFRINGENCE TOPOGRAPHY

Observation of screw and mixed dislocations in barium nitrate crystals by means of birefringence and x-ray topography

A study of dislocations generated by inclusions in gadolinium gallium garnet crystals by birefringence topography

Observation of the Photorefractive Effects in Bent-Core Liquid Crystals.

BIREFRINGENCE IMAGES OF SCREW DISLOCATIONS VIEWED END-ON IN GGG AND YAG CRYSTALS

DISLOCATIONS AND INCLUSIONS IN CZOCHRALSKI METHOD-GROWN YAG SINGLE CRYSTALS

Birefringence Images of Screw Dislocations Viewed End-on in Cubic Crystals

Optical anisotropy and strain-induced birefringence in dislocation-free silicon single crystals

Direct observation of defects in transparent crystals by optical microscopy

Origin of Structural Relaxation Dependent Spectroscopic Features of Bismuth-Activated Glasses.

Study of A[001] and A[110] Screw Dislocations Viewed End-On in Crystal Ba(No3)(2) by Birefringence Topography

Birefringence Images of Screw Dislocations Viewed End on in Cubic-Crystals Containing A Long-Range Stress-Field

Contrast Reversal of Antiparallel Domains in Cu-doped (ba0.25sr0.75)0.9(k0.5na0.5)0.2nb2o6 Single Crystal with Synchrotron Topography

Reflection Electron Microscopy Observations of Dislocations and Dislocation Motion in Zinc Oxide

Dislocation generation and propagation in Czochralski Alexandrite single crystals

Imaging of Microdefects in ZnGeP2 Single Crystals by X-ray Topography

Unusual luminescence quenching and reviving behavior of Bi-doped germanate glasses.

Broadband Near-Infrared Luminescence from Gamma-Ray Irradiated Bismuth-Doped Y4geo8 Crystals

Intrinsic Broadening of the Modulation-Related Reflections in a High-Quality Bi2Sr2CaCu2Oy Crystal

OBSERVATION OF DISLOCATIONS AND SUBBOUNDARIES IN OPTICALLY ACTIVE CRYSTAL Bi&lt;sub&gt;12&lt;/sub&gt;GeO&lt;sub&gt;20&lt;/sub&gt; BY MEANS OF REFLECTION BIREFRINGENCE TOPOGRAPHY